Apparatus and method for real-time spectral alignment for open-path fourier transform infrared spectrometers
Patent 5959730 Issued on September 28, 1999. Estimated Expiration Date: 
December 17, 2017. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
December 17, 2017. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesApparatus and method for detection of molecular vapors in an atmospheric region Apparatus and method for real-time spectral alignment for open-path fourier transform infrared spectrometers Patent #: 5790250 InventorsApplicationNo. 992227 filed on 12/17/1997US Classes:356/451, Spectroscopy356/498Displacement or distanceExaminersPrimary: Kim, Robert H.Attorney, Agent or FirmInternational ClassG01B 009/02AbstractAn improved method for use with an open-path fast Fourier infrared spectrometer performs real-time, spectral alignment on measured interferograms to reduce measuremental errors. The improved method includes the step of selecting a plurality of water-vapor lines in a defined spectral region and comparing the centerline of these measured water vapor lines to a reference library. From these comparisons, the spectrometer calculates correction factors to apply to the spectrometer bandwidth. The improved spectrometer performs transform functions on selected segments of the spectrometer bandwidth which introduce integer-continuous corrective shifts on subsequently measured interferogram data.Other References
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