Integrated circuit transporting apparatus including a guide with an integrated circuit positioning function
Patent 5920192 Issued on July 6, 1999. Estimated Expiration Date: 
June 14, 2016. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
June 14, 2016. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesDie attach pickup tools Apparatus for testing IC elements IC test equipment IC test equipment having a horizontally movable chuck carrier Magnetic flux guide having tongues and magnetoresistive transducer incorporating said guide Tester for integrated circuits Patent #: 5596282 InventorAssigneeApplicationNo. 663682 filed on 06/14/1996US Classes:324/158.1MISCELLANEOUSExaminersPrimary: Ballato, JosieAssistant: Kobert, Russell M. Attorney, Agent or FirmForeign Patent References
International ClassG01R 001/04Foreign Application Priority Data1995-07-03 JPAbstractA low cost IC transporting apparatus locates a semiconductor device at an accurate position, picks up the semi-conductor device by suction, and transports the semiconductor device. A play is provided in a positioning recessed portion having upwardly inclined surfaces so that a semiconductor device fallen into the positioning recessed portion can move in a horizontal direction. A guide surrounds a device suction unit picking up by suction the semiconductor device fallen into the positioning recessed portion. The guide guides the device suction unit to pick up by suction the semiconductor device at a predetermined suction position. Downwardly projected ridged portions are provided on the lower end of the guide, each of which includes a shape conforming to a corresponding one of the upwardly inclined surfaces of the positioning recessed portion. The guide also includes flat portions provided at the base portion of the ridged portions thereof. The flat portions abut against an upper end surface of the positioning recessed portion when the ridged portions of the guide engage with the upwardly inclined surfaces of the positioning recessed portion without any play therebetween.Other References
Field of SearchVacuum-type holding meansWith probe elements Internal of or on support for device under test (DUT) Contact confirmation Probe contact enhancement Probe alignment or positioning With recording of test results on DUT With temperature control Pin Cantilever DUT including test circuit With identification of DUT MISCELLANEOUS | |
