Patent References 3756723 3876304 Measurement of deformation Universal spectrometer system having modular sampling chamber Optical wavelength selective devices having rigid support structure Compact portable diffraction moire interferometer Mirror surface characteristic testing Beam shuttering interferometer and method Patent #: 5231468 InventorsApplicationNo. 218000 filed on 03/25/1994US Classes:356/35.5By light interference detector (e.g., interferometer)ExaminersPrimary: Turner, Samuel A.Attorney, Agent or FirmInternational ClassG01B 009/02AbstractA moire interferometer which is both portable and shielded from the environment, as well as a corresponding moire interferometric method, are disclosed.Other References
| |