U.S. patents available from 1976 to present.
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Autofocus system for scanning microscopy

Patent 5790710 Issued on August 4, 1998. Estimated Expiration Date: Icon_subject January 17, 2017. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

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Inventors

Assignee

Application

No. 785614 filed on 01/17/1997

US Classes:

382/255, Focus measuring or adjusting (e.g., deblurring)250/201.3, Of a microscope348/345, Focus control382/141Manufacturing or product inspection

Examiners

Primary: Mancuso, Joseph
Assistant: Patel, Rajnikant B.

Attorney, Agent or Firm

Foreign Patent References

  • 0163394 A2 EP 12/13/1985
  • 2615841 A1 NL 10/13/1977
  • 3828381 A1 NL 03/13/1990
  • 4226523 A1 NL 02/13/1994

International Classes

G06K 009/40
G06K 009/00

Abstract

Reliable autofocus is required to obtain accurate measurements of fluorescent stained cellular components from a system capable of scanning multiple microscope fields. Autofocus could be performed directly with fluorescence images, but due to photobleaching and destructive fluorescence by-products, it is best to minimize fluorescence exposure for photosensitive specimens and live cells. This exposure problem could be completely avoided by using phase-contrast microscopy, implemented through the same optics as fluorescence microscopy. Functions for both phase-contrast and fluorescence autofocus were evaluated using the present invention and the suitability of phase-contrast autofocus for fluorescence microscopy was determined. The present autofocus system for scanning microscopy can be performed at least as fast as 0.25 s/field without loss of precision.

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