U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Polish pad conditioner with radial compensation

Patent 5785585 Issued on July 28, 1998. Estimated Expiration Date: Icon_subject September 18, 2015. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Method for conditioning the surface of a polishing pad
Patent #: 5081051
Issued on: 01/14/1992
Inventor: Mattingly, et al.

Polishing pad conditioning apparatus for wafer planarization process
Patent #: 5216843
Issued on: 06/08/1993
Inventor: Breivogel, et al.

Conditioner for a polishing pad and method therefor
Patent #: 5456627
Issued on: 10/10/1995
Inventor: Jackson, et al.

Preconditioner for a polishing pad and method for using the same
Patent #: 5527424
Issued on: 06/18/1996
Inventor: Mullins

Application of semiconductor IC fabrication techniques to the manufacturing of a conditioning head for pad conditioning during chemical-mechanical polish
Patent #: 5595527
Issued on: 01/21/1997
Inventor: Appel, et al.

Method and apparatus for conditioning of chemical-mechanical polishing pads
Patent #: 5611943
Issued on: 03/18/1997
Inventor: Cadien, et al.

Surface treatment of polishing cloth Patent #: 5626509
Issued on: 05/06/1997
Inventor: Hayashi

Inventors

Application

No. 529823 filed on 09/18/1995

US Classes:

451/288, Having pressure plate451/41, Glass or stone abrading451/56, With tool treating or forming451/285, Rotary work holder451/286, By means loosely confining work451/287, Planar surface abrading451/289, Having vacuum or adhesive securing means451/443, Dressing451/444, Tool cleaner451/446Abradant supplying

Examiners

Primary: Rose, Robert A.
Assistant: Nguyen, George

Attorney, Agent or Firm

International Class

B24B 005/00

Abstract

An apparatus for and method of conditioning a polishing pad suitable for in-situ use, is described. The apparatus consists of a wedge-shaped conditioning plate whose width varies as a function of its length and whose exact geometry is a function of the radial effects of the polishing process effecting conditioning of the polishing pad. The conditioning plate rests on the polishing pad and is surrounded by a loose-fitting frame that holds the conditioning plate stationary with respect to the rotating polishing table, preventing lateral movement of the conditioning plate, but allowing the plate to move in the vertical direction so that it can rest flat on the polishing pad. The bottom face of the conditioning plate has a roughened surface that serves to abrade the polishing pad and conditions it to an extent determined ostensibly by the downward force of the conditioning plate on the polishing pad, the roughness of the bottom surface of the conditioning plate, and the time the conditioning plate is in contact with the polishing pad surface.

Other References

  • IBM Technical Disclosure Bulletin vol.37 No.04B Apr. 1994 Title: "Novel Pad Conditioning Technology for Polishing Wafers"
  • 32227 "Pad Conditioning to Control Radial Uniformity of Mechanical Polishing" Reproduced from Research Disclosure, Feb. 1991, No. 322 c Kenneth Mason Publications Ltd, England
  • Thin Solid Films, 220(1992)1-7 "Integration of Chemical-Mechanical Polishing Into CMOS Integrated Circuit Manufacturing" Howard Landis, et al. IBM Techology Products, Essex Junction, VT 05452(USA
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