U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Method to reduce particulates in device manufacture

Patent 5766369 Issued on June 16, 1998. Estimated Expiration Date: Icon_subject October 4, 2016. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3765941

Ultrasonic cleaning apparatus for an electrostatographic reproducing machine
Patent #: 4111546
Issued on: 09/05/1978
Inventor: Maret

Method of manufacturing semiconductor wafer and system therefor Patent #: 5427644
Issued on: 06/27/1995
Inventor: Nagatsuka, et al.

Inventors

Assignee

Application

No. 726181 filed on 10/04/1996

US Classes:

134/1.3, Semiconductor cleaning134/1, Including application of electrical radiant or wave energy to work134/6, Using solid work treating agents134/32, With work or work parts movable during treatment257/E21.224Chemical cleaning (EPO)

Examiners

Primary: Warden, Jill
Assistant: Markoff, Alexander

Attorney, Agent or Firm

International Class

B08B 007/02

Abstract

An improved process for manufacturing semiconductor devices (10). The device, which could be a semiconductor wafer, an individual chip, or a device that has integrated within it semiconductor devices, such as a compact disk drive, is placed or held upside down with its working surface (12) open. The device (10) is struck, causing particulates (18) attached to the working surface (12) to fall free of the device. Alternately, the device could be sharply decelerated to apply the shock. Additionally, the device could be held substantially vertical and rotated to use centrifugal force to separate the particulates away from the device.

Other References

  • Handbook of Semiconductor Wafer Cleaning Technology, Werner Kern editor, Noyes publications, 199
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