U.S. patents available from 1976 to present.
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Phase measurement apparatus and method

Patent 5754437 Issued on May 19, 1998. Estimated Expiration Date: Icon_subject September 10, 2016. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

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Inventor

Assignee

Application

No. 711837 filed on 09/10/1996

US Classes:

702/75, Frequency327/156, Phase lock loop327/159, With digital element370/516, Adjusting for phase or jitter375/226, Phase error or phase jitter375/371, Phase displacement, slip or jitter correction375/373, Phase locking375/375, With frequency detector and phase detector375/376, Phase locked loop702/69, Signal quality (e.g., timing jitter, distortion, signal-to-noise ratio)702/79, Time-related parameter (e.g., pulse-width, period, delay, etc.)708/313Decimation/interpolation

Examiners

Primary: Trammell, James P.
Assistant: Nguyen, Hoang

Attorney, Agent or Firm

International Classes

H04L 007/00
H04L 025/36

Abstract

A phase measurement apparatus and method for measuring electrical signal jitter and wander operates in real time and digitally controls bandwidths over which the measurements are performed. The apparatus includes a digital phase-lock loop (PLL) for generating phase difference signal data having first and second frequency components above and below the loop bandwidth of the phase locked loop. An analog-to-digital converter digitizes the analog phase difference signal from the phase detector. A digital signal processor (DSP) receives the digital data and performs a loop filter function for generating frequency update values to the DDS for phase locking the PLL to an incoming signal. The DSP performs an integration function on the loop filter function output to generate the second frequency components. The first and second frequency components are combined in a summing circuit and filtered in digitally programmable low and high pass filters for establishing measurement bands for measuring the phase difference. A measurement processor measures peak-to-peak minimum and maximum values and generates RMS values of the phase difference signal over a selected time interval and generating an output in unit intervals for jitter and time for wander. The DSP further includes low and high pass filter functions and an accumulator for summing filtered second frequency components to generate wander data. The DSP processes the frequency update values to generate frequency drift data.

Other References

  • "Broadcast Quality Video Over SDH Networks; Eradicating Sub Carrier Corruption Due To pointers," J.A. Shields et al., IBC 95 Intl. Broadcasting Convention Pub. No. 413, pp. 269-273, Sep. 1995, IEEE, London, U.K
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  • Mark Haas, "Modulation Domain Analysis -A New Method for Measuring Jitter on Digital Devices" by Tom Carrico of HP Co., http://www.haas.com/doc/jitter.htm
  • "DSP CARD 4 User Manual and Application Software", http://www.daisy.cheque.uq.edu.au/vk4yeq/DSP$/manual/manual.html, and http://www.trap.org/dsp/dsp4/application.html., Apr. 199
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