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Three-dimensional shape measuring apparatus

Patent 5737084 Issued on April 7, 1998. Estimated Expiration Date: Icon_subject September 26, 2016. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Inventor

Assignee

Application

No. 721051 filed on 09/26/1996

US Classes:

356/609By focus detection

Examiners

Primary: Font, Frank G.
Assistant: Merlino, Amanda

Attorney, Agent or Firm

Foreign Patent References

  • 7-181023 JP. 07/12/1995

International Class

G01B 011/24

Foreign Application Priority Data

1995-09-29 JP

Abstract

A three-dimensional shape measuring apparatus which has an improved arrayed confocal imaging system.A three-dimensional shape measuring apparatus using a confocal imaging system which has a new means for changing the distance in the Z direction between the object and the object-position-in-focus, instead of an object stage moved in the Z direction. This means shifts the object-position-in-focus in the Z direction by refraction. One means inserts a plurality of transparent flat plates between the objective lens and the object-position-in-focus in turn. Another means uses a transparent flat plate made of a material for which the refractive index changes according to the voltage applied and is disposed between the object and the object-position-in-focus.A three-dimensional shape measuring apparatus using a confocal imaging system wherein an image processor estimates the position from which the intensity of the reflected light for each pixel of the confocal image becomes maximum by interpolation of a value from the curve of the relationship between the intensity of light detected and the distance from the object-position-in-focus to an object point.

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