Rosette-type optical microsystem of strain gauges having dielectric guides for measuring a longitudinal strain in a planar structure
Patent 5726744 Issued on March 10, 1998. Estimated Expiration Date: 
October 30, 2015. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
October 30, 2015. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesDistributed, spatially resolving optical fiber strain gauge Fiber optic bending and positioning sensor including a light emission surface formed on a portion of a light guide Fiber grating-based sensing system with interferometric wavelength-shift detection Patent #: 5361130 InventorsApplicationNo. 550029 filed on 10/30/1995US Classes:356/32, MATERIAL STRAIN ANALYSIS250/227.14, Condition responsive light guide (e.g., light guide is physically affected by parameter sensed which results in light conveyed to the photocell)250/227.16, With detection of fiber microbend caused by parameter affecting fiber385/12, OPTICAL WAVEGUIDE SENSOR385/13Including physical deformation or movement of waveguideExaminersPrimary: Font, Frank G.Assistant: Stafira, Michael P. Attorney, Agent or FirmInternational ClassG01B 011/16Foreign Application Priority Data1994-11-18 FRAbstractThe present invention relates to a planar, rosette-type, optical microsystem with strain gauges having dielectric guides used for measuring a system of strains or stresses applied to a part, in which the part is under purely longitudinal strain, at least one rosette being formed by at least two strain gauges with dielectric guides (J1, J2, J3) and in which a calculating circuit makes it possible to determine said strain by resolving a system of equations.Other References
Field of SearchMATERIAL STRAIN ANALYSISOPTICAL WAVEGUIDE SENSOR Including physical deformation or movement of waveguide INTEGRATED OPTICAL CIRCUIT Coupling between modes in a waveguide or fiber WITH SPLICE (PERMANENT CONNECTION) Fusion splicing With detection of fiber microbend caused by parameter affecting fiber Condition responsive light guide (e.g., light guide is physically affected by parameter sensed which results in light conveyed to the photocell) Optical | |
