U.S. patents available from 1976 to present.
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Cyanooxime sulfonate compound

Patent 5714625 Issued on February 3, 1998. Estimated Expiration Date: Icon_subject September 12, 2016. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Process for curing acid-curable finishes
Patent #: 4540598
Issued on: 09/10/1985
Inventor: Berner ,   et al.

Oxime sulfonates containing reactive groups
Patent #: 4736055
Issued on: 04/05/1988
Inventor: Dietliker ,   et al.

Method of producing an image reversal negative photoresist having a photo-labile blocked imide
Patent #: 5019488
Issued on: 05/28/1991
Inventor: Mammato, et al.

Diazodisulfones Patent #: 5216135
Issued on: 06/01/1993
Inventor: Urano, et al.

Inventors

Assignee

Application

No. 712884 filed on 09/12/1996

US Classes:

558/437The sulfur is double bonded to oxygen

Examiners

Primary: Richter, Johann
Assistant: Sackey, Ebenezer

Attorney, Agent or Firm

Foreign Patent References

  • 0 044 115 EP. 01/23/1982
  • 0 241 423 EP. 10/23/1987
  • 0 361 907 EP. 04/23/1990
  • 0 571 330 EP. 11/23/1993

International Class

C07C 255/35

Foreign Application Priority Data

1995-09-29 JP

Abstract

Disclosed is a class of novel cyanooxime sulfonate compounds represented by the general formulaNC--CR1 =N--O--SO2 --R2,in which R1 and R2 are, each independently from the other, an unsubstituted or halogen-substituted monovalent aliphatic hydrocarbon group selected from the group consisting of alkyl, cycloalkyl, alkenyl and cycloalkenyl groups. The group R1 is preferably a cycloalkenyl group, e.g. 1-cyclopentenyl or 1-cyclohexenyl group, and R2 is preferably a lower alkyl group having 1 to 4 carbon atoms. The compound releases an acid by the irradiation with ultraviolet light and is useful as an acid generating agent in an acid-sensitive photoresist composition. By virtue of the high transparency of the compound to ultraviolet, high acid strength of the acid generated therefrom and good solubility of the compound in organic solvents, the photoresist composition compounded with the compound as an acid generating agent is imparted with high sensitivity to ultraviolet and capable of giving a patterned resist layer having excellent characteristics.

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