Method and apparatus for terahertz imaging
Patent 5710430 Issued on January 20, 1998. Estimated Expiration Date: 
September 10, 2016. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
September 10, 2016. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesMethod for optically inspecting human body and apparatus for the same Ultrafast optical imaging of objects in a scattering medium Apparatus for measuring absorption information in scattering medium and method therefor Apparatus for measuring optical information in scattering medium and method therefor Method and apparatus for terahertz imaging Patent #: 5623145 InventorApplicationNo. 711823 filed on 09/10/1996US Classes:250/358.1, With means to inspect passive solid objects250/330, INFRARED-TO-VISIBLE IMAGING250/341.1With irradiation or heating of object or materialExaminersPrimary: Glick, Edward J.Attorney, Agent or FirmInternational ClassesG01N 021/17G01N 021/49 AbstractCertain material and objects can be characterized by a frequency-dependent absorption, dispersion, and reflection of terahertz transients in signals which pass illuminate the material or object. The present terahertz imaging system analyses that frequency dependence in the time-domain by collecting that transmitted signal propagating through the object and then processing the information contained in those signals for every point or "pixel" on that object. This is a non-invasive imaging technique that is capable of differentiating between different materials, chemical compositions, or environments. | |
