Semiconductor integrated circuit device
CMOS powerless rom code mask option select
Modularized scan path for serially tested logic circuit
Partitioned scan-testing system
Dynamic semiconductor memory device having a simultaneous test function for divided memory cell blocks
Packaged semiconductor device with test circuits for determining fabrication parameters
Standard cell having test pad for probing and semiconductor integrated circuit device containing the standard cells
Built-in-test by signature inspection (bitsi)
Spatial light modulator and method
Standard independent digitized video system
ApplicationNo. 347021 filed on 11/30/1994
US Classes:324/763, DUT including test circuit324/765, Test of semiconductor device714/733Built-in testing circuit (BILBO)
ExaminersPrimary: Karlsen, Ernest F.
Attorney, Agent or Firm
International ClassG01R 031/28
AbstractA large integrated circuit (10) of modular design, each module (12,14,16) having a circuit section (22,24,34) and a separate dedicated testing pad section (20). Each circuit module (12,14,16) can be individually functionally tested as an independent circuit with conventional prober equipment for defects. Each testing pad section (20) facilitates controlling the entire integrated circuit (10) so that the respective module circuit section (12,14,16) can be tested. Control circuitry (26) comprised of pass gates is provided to isolate the testing pad sections (20) from the operational portion (22,24,34) of the integrated circuit (10) when not under test. The present invention is ideally suited for large spatial light modulators, memory devices and other large sophisticated integrated circuits.