U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

System for optically measuring the surface contour of a part using more fringe techniques

Patent 5636025 Issued on June 3, 1997. Estimated Expiration Date: Icon_subject June 17, 2014. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3245307

Interferometric measuring system
Patent #: 4188124
Issued on: 02/12/1980
Inventor: Jaerisch ,   et al.

Method and system for surface contouring
Patent #: 4212073
Issued on: 07/08/1980
Inventor: Balasubramanian

Non-contact measurement of surface profile
Patent #: 4349277
Issued on: 09/14/1982
Inventor: Mundy ,   et al.

Method and apparatus for reconstruction of three-dimensional surfaces from interference fringes
Patent #: 4525858
Issued on: 06/25/1985
Inventor: Cline ,   et al.

Apparatus and method for projection moire topography
Patent #: 4564295
Issued on: 01/14/1986
Inventor: Halioua

Moire microscope
Patent #: 4577940
Issued on: 03/25/1986
Inventor: Krasinski ,   et al.

Method and apparatus for surface profilometry
Patent #: 4641972
Issued on: 02/10/1987
Inventor: Halioua ,   et al.

Field shift moire system
Patent #: 5069548
Issued on: 12/03/1991
Inventor: Boehnlein

Method and apparatus for absolute Moire distance measurements using a grating printed on or attached to a surface
Patent #: 5075562
Issued on: 12/24/1991
Inventor: Greivenkamp, Jr., et al.

More ...

Inventors

Application

No. 262130 filed on 06/17/1994

US Classes:

356/619, Quadrature detection250/237GGratings (moire fringes)

Examiners

Primary: Gonzalez, Frank
Assistant: Eisenberg, Jason D.

Foreign Patent References

  • 0121353A1 EP. 10/13/1984

International Classes

G01B 011/24
G01B 011/00

Abstract

An optical measuring system comprises an illumination arrangement including a light source, grating, and lens, and an image acquisition arrangement, including a lens, grating, and camera. A mechanical translation device moves the grating in a plane parallel to a reference surface to effect a phase shift of a projected image of the grating on the contoured surface to be measured. A second mechanical translation device moves the lens to effect a change in the contour interval. A first phase of the points on the contoured surface is taken, via a four-bucket algorithm, at a first contour interval. A second phase of the points is taken at a second contour interval. A controller, including a computer, determines a coarse measurement using the difference between the first and second phases. The controller further determines a fine measurement using either the first or second phase. The displacement or distance, relative to the reference plane, of each point is determined, via the controller, using the fine and coarse measurements.

Other References

  • Boehnlein, Albert and Harding, Kevin, Fringe Pattern Analysis, "Field Shift Moire, A New Technique for Absolute Range Measurement" The International Society for Optical Engineering, San Diego, California, 8-9 Aug. 1989, SPIE vol. 1163, pp. 2-13
  • Yashizawa, Toru, et al., "Shadow Moire Topography By Means of the Phase-Shift Method" Optical Engineering, Jul., 1993, vol. 32, No. 7, pp. 1668-1674
  • Bieman, Leonard H. et al., "Absolute Measurement Using Field Shifted Moire" Optics, Illumination, and Image Sensing for Machine Vision VI, The International Society for Optical Engineering, Boston, Massachusetts, 14-15 Nov. 1991, SPIE 1614, pp. 259-264
  • Harding, et al., "Moire Interferometry Gives Machine Vision a Third Dimension", Sensors, Oct. 1989, pp. 24-31
  • Wyant, J.C., "Use of an AC Heterodyne Lateral Shear Interferometer with Real-Time Wavefront Correction Systems" Applied Optics, vol. 14, No. 11, Nov. 1975, pp. 2622-2626
  • Boehnlein, et al., "Adaptation of a Parallel Architecture Computer to Phase Shifted Moire Interferometry," Reprinted from SPIE vol. 728, Optics, Illumination, and Image Sensing for Machine Vision, (1986), pp. 183-194
  • Idesawa, et al., "Scanning Moire Method and Automatic Measurement of 3-D Shapes" Applied Optics, vol. 16, No. 8, Aug. 1977, pp. 2152-2162
  • Cheng, et al., "Phase Shifter Calibration in Phase-Shiftng Interferometry", Applied Optics vol. 24, No. 18, Sep. 15, 1985, pp. 3049-3052
  • Bruning, et al., "Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses" Applied Optics, vol. 13, No. 11, Nov. 1974, pp. 2693-2703
  • Chiang et al, "Moire-Fringe Interpolation and Multiplication by Fringe Shifting" Exp. Mech, 8(12), Dec. 1968, pp. 544-56
PatentsPlus Images
Enhanced PDF formats
loading...
PatentsPlus: add to cart
PatentsPlus: add to cartSearch-enhanced full patent PDF image
$9.95more info
PatentsPlus: add to cart
PatentsPlus: add to cartIntelligent turbocharged patent PDFs with marked up images
$16.95more info
 
Sign InRegister
Username  
Password   
forgot password?