Patent ReferencesWeighted capacitor analog/digital converting apparatus and method Sequential successive approximation analog-to-digital converter Dynamically calibrated successive ranging A/D conversion system and D/A converter for use therein On board self-calibration of analog-to-digital and digital-to-analog converters Pipelined A/D converter Self-calibrating pipelined subranging analog-to-digital converter Pipelined analog-to-digital architecture with parallel-autozero analog signal processing Architecture for high sampling rate, high resolution analog-to-digital converter system Autocalibrated multistage A/D converter Analog-to-digital converter employing a pipeline multi-stage architecture InventorsAssigneeApplicationNo. 366563 filed on 12/30/1994US Classes:341/161, Acting sequentially341/118, CONVERTER COMPENSATION341/120CONVERTER CALIBRATION OR TESTINGExaminersPrimary: Gaffin, JeffreyAssistant: Kost, Jason L. W. Attorney, Agent or FirmInternational ClassH03M 001/38Foreign Application Priority Data1993-12-31 KRAbstractA pipelined multi-stage analog-to-digital converter (ADC) exhibits high speed and high resolution characteristics in a small chip area using a CMOS process. An optimized high resolution multi-stage ADC improves integral non-linearity errors (INL) and differential non-linearity (DNL) errors and hence increases yield. A binary-weighted capacitor array is used in a multiplying digital-to-analog converter (MDAC) in a front-end stage, and a unit capacitor array is used in the MDACs of the latter stages thereof. Offset, feedthrough and gain errors are removed via digital correction. A digital calibration technique is adopted to reduce the non-ideal effects resulting from component mismatch, by measuring all the code errors of the front-end stage, to thereby minimize the midpoint code DNL error without reference to code symmetry. | |