High performance RAM array circuit employing self-time clock generator for enabling array accessess
Patent 5619464 Issued on April 8, 1997. Estimated Expiration Date: 
June 7, 2015. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
June 7, 2015. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesMemory device having a non-uniform redundancy decoder arrangement Patent #: 5270975 InventorAssigneeApplicationNo. 473103 filed on 06/07/1995US Classes:365/203, Precharge365/233Sync/clockingExaminersPrimary: Fears, Terrell W.Attorney, Agent or FirmInternational ClassG11C 013/00AbstractA RAM array circuit is provided which includes a memory array formed by several RAM cell columns. A particular cell within each column and row may be selected for access (either read or write) by an address decode circuit. The RAM array circuit employs a self-time column having a delay characteristic which is approximately equal to that of each of the RAM cell columns. The rising edge of a single-phase clock is used to precharge each RAM cell column as well as the self-time column. As the self-time column is precharged to a high level, the self-time control circuit disables the precharge and enables the array access for read or write. When a particular row is selected by the address decoding mechanism, the self-time column is discharged. Once the self-time column has discharged, a sense amplifier is enabled to read data from the array. Access is then disabled and precharge is again enabled upon the next rising edge of the clock. | |
