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US Patent 5610391 - Optical inspection of container finish dimensional parameters
US Patent Issued on March 11, 1997
Estimated Patent Expiration Date:
August 25, 2014Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
Estimated Patent Expiration Date:
August 25, 2014Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.AbstractApparatus for inspecting external dimensional parameters of a container finish that includes a light source for directing light energy onto the finish of the container and a matrix array sensor disposed to receive an image of the container finish illuminated by the light source. A telecentric lens is positioned to focus onto the matrix array sensor an image of the container finish profile formed by light energy traveling parallel to the telecentric lens axis, such that the finish profile appears as a dark image against a light background at the sensor. The matrix array sensor is scanned at increments of container rotation to determine one or more dimensional parameters of the container finish. | InventorAssigneeApplicationNo. 296297 filed on 08/25/1994US Classes:250/223B, Bottles250/208.1, Plural photosensitive image detecting element arrays356/239.4Containers (e.g., bottles)Field of Search250/208.1, Plural photosensitive image detecting element arrays250/223BBottlesExaminersPrimary: Allen, Stephone B.US Patent References4064534, System for monitoring the production of items which are initially difficult to physically inspectIssued on: 12/20/1977 Inventor: Chen , et al.4230219, Cavity identification handling system Issued on: 10/28/1980 Inventor: Pezzin , et al.4376951, Foreign matter detecting device Issued on: 03/15/1983 Inventor: Miyazawa4378493, Glass container sidewall defect detection system with a diffused and controlled light source Issued on: 03/29/1983 Inventor: Dorf , et al.4386828, Telecentric illumination system Issued on: 06/07/1983 Inventor: Hirose4492476, Defect detecting method and apparatus Issued on: 01/08/1985 Inventor: Miyazawa4526443, Telecentric illumination system Issued on: 07/02/1985 Inventor: Hirose4701612, Inspection of container finish Issued on: 10/20/1987 Inventor: Sturgill4725856, Method of and apparatus for checking defectively fused ampoules Issued on: 02/16/1988 Inventor: Fujikura4786801, Finish Leak Detector having vertically movable light source Issued on: 11/22/1988 Inventor: Shay4792695, Contact-free measuring apparatus having an F-theta-corrected, catadioptric objective and method for using the same Issued on: 12/20/1988 Inventor: Blandford4906098, Optical profile measuring apparatus Issued on: 03/06/1990 Inventor: Thomas, et al.4958223, Inspection of container finish Issued on: 09/18/1990 Inventor: Juvinall, et al.5008743Telecentric imaging system optical inspection machine using the same and method for correcting optical distortion produced thereby Issued on: 04/16/1991 Inventor: Katzir, et al. Foreign Patent References
International ClassG01N 009/04 |
