U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Method and apparatus for determining mis-registration

Patent 5592573 Issued on January 7, 1997. Estimated Expiration Date: Icon_subject October 11, 2014. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3748644

Optical inspection system for printing flaw detection
Patent #: 4197584
Issued on: 04/08/1980
Inventor: Blazek

Process for assessing the quality of a printed product
Patent #: 4311914
Issued on: 01/19/1982
Inventor: Huber

Image processing system
Patent #: 4635293
Issued on: 01/06/1987
Inventor: Watanabe

Pattern inspection system
Patent #: 4783826
Issued on: 11/08/1988
Inventor: Koso

Pattern recognition system
Patent #: 4852183
Issued on: 07/25/1989
Inventor: Abe ,   et al.

View-to-view image correction for object motion
Patent #: 4858128
Issued on: 08/15/1989
Inventor: Nowak

Fine-grained microstructure processor
Patent #: 4982439
Issued on: 01/01/1991
Inventor: Castelaz

Apparatus for reading a document and processing the image Patent #: 5086486
Issued on: 02/04/1992
Inventor: Yamada

Inventors

Assignee

Application

No. 320570 filed on 10/11/1994

US Classes:

382/294, Registering or aligning multiple images to one another382/151, Alignment, registration, or position determination382/218Comparator

Examiners

Primary: Couso, Jose L.
Assistant: Bella, Matthew C.

Attorney, Agent or Firm

Foreign Patent References

  • 0197734 EP 10/13/1986
  • 0440137 EP 08/13/1991
  • 0449336 EP 10/13/1991
  • 0485051 EP 05/13/1992

International Classes

G06K 009/32
G06K 009/68

Abstract

An image processing apparatus includes a data acquisition stage for acquiring data representative of several spatially separated regions of a sample. The apparatus also includes data storage means for storing reference data corresponding to the sample data. The two sets of data are compiled and analyzed to determine if the sample is shifted from a nominal position.

Other References

  • Patent Abstracts of Japan; vol. 7, No. 113 (M-221) 10 Jun. 1983 & JP-A-58 049 262 (Dainippon Insatsu KK) 23 Mar. 1983
  • European Search Report No. EP 93 81 0534; Communication No. 93810534.3-dated Nov. 5, 199
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