Method and apparatus for cooperated design
November 5, 2013. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesProduction system for manufacturing semiconductor devices Computer simulation system Optimized process control method and apparatus therefor Method for synthesizing analysis model and flow analysis system Optimum loom control method Conceptual design tool Method of optimizing a serial manufacturing system Product specification complex analysis system Method and apparatus for resource constraint scheduling Patent #: 5406476 InventorsAssigneeApplicationNo. 905888 filed on 06/29/1992US Classes:700/95Product assembly or manufacturingExaminersPrimary: Envall, Roy N. Jr.Assistant: Oakes, Brian C. Foreign Patent References
International ClassG06F 019/00Foreign Application Priority Data1991-07-03 JPAbstractIn order to derive optimum design specifications based on total evaluation performed on a product as a whole instead of individual design items during a process of determining design specifications involving a plurality of design items, candidates for the product specifications are selected by controlling design parameters for each of the design items in an integrated manner, computing values of a plurality of evaluation items evaluating candidates for the design specifications and performing total evaluation on all the evaluation items based on their computed values through collaboration among a plurality of design sections altogether auto-correcting all relevant design parameters quickly and relaxing as well as reassessing design constraints for a design parameter.Other References
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