U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Cylindrical fiber probes and methods of making them

Patent 5570441 Issued on October 29, 1996. Estimated Expiration Date: Icon_subject May 20, 2014. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Etching of optical fibers
Patent #: 4265699
Issued on: 05/05/1981
Inventor: Ladany

Optical near-field scanning microscope
Patent #: 4604520
Issued on: 08/05/1986
Inventor: Pohl

Near field scanning optical microscopy
Patent #: 4917462
Issued on: 04/17/1990
Inventor: Lewis, et al.

Photon scanning tunneling microscopy
Patent #: 5018865
Issued on: 05/28/1991
Inventor: Ferrell, et al.

Near-field scanning optical microscope using a fluorescent probe
Patent #: 5105305
Issued on: 04/14/1992
Inventor: Betzig, et al.

Near field scanning optical microscope having a tapered waveguide
Patent #: 5272330
Issued on: 12/21/1993
Inventor: Betzig, et al.

Fiber probe device having multiple diameters Patent #: 5394500
Issued on: 02/28/1995
Inventor: Marchman

Inventors

Assignee

Application

No. 247165 filed on 05/20/1994

US Classes:

385/43, Tapered coupler65/429, With etching or leaching385/123OPTICAL FIBER WAVEGUIDE WITH CLADDING

Examiners

Primary: Lee, John D.
Assistant: Palmer, Phan T. H.

Attorney, Agent or Firm

Foreign Patent References

  • 0 487 233 A3 EP. 05/13/1992

International Class

G02B 006/26

Abstract

This invention involves a fiber probe device and a method of making it. The probe includes a relatively thick upper cylindrical portion, typically in the form of a solid fight circular cylinder, terminating in a tapered portion that terminates in a relatively thin lower cylindrical portion, typically also in the form of a solid right circular cylinder, the lower portion having a width (diameter) in the approximate range of as little as approximately 0.05 μm.

Other References

  • Wickramasinghe, H. K., "Scanned-Probe Microscopes," Scientific American, vol. 261, No. 4, pp. 98-105(Oct. 1989)
  • Binnig, G. et al., "Atomic Force Mircoscope," Phys. Rev. Lett., vol. 56, No. 9, Mar. 3, 1986, pp. 930-933
  • "Photon Scanning Tunneling Microscopy", by R. C. Reddick et al., Review of Scientific Instruments, vol. 61, No. 12, Dec. 1990, pp. 3669-367
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