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US Patent 5559328 - Small cavity analytical instruments

US Patent Issued on September 24, 1996
Estimated Patent Expiration Date: Icon_subject July 29, 2014Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
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Abstract

A sample and the tip portion of an alternating current scanning tunneling microscope are electrically enclosed within a cavity with electrically conductive walls. The dimensions of the cavity are smaller than the wavelength of a component of the AC signal applied by the probe to the sample so that the output signal detected by the probe from the sample will not be contaminated by resonant effects of the cavity.

Other References

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Inventors

Assignee

Application

No. 283007 filed on 07/29/1994

US Classes:

250/306, INSPECTION OF SOLIDS OR LIQUIDS BY CHARGED PARTICLES250/440.11, Analyte supports324/636With a resonant cavity

Field of Search

250/306, INSPECTION OF SOLIDS OR LIQUIDS BY CHARGED PARTICLES250/307, Methods250/440.11, Analyte supports250/442.11, With object moving or positioning means324/636With a resonant cavity

Examiners

Primary: Berman, Jack I.

Attorney, Agent or Firm

US Patent References

3566262, 4941753, Absorption microscopy and/or spectroscopy with scanning tunneling microscopy control
Issued on: 07/17/1990
Inventor: Wickramasinghe
5060248, Scanning analysis and imaging system with modulated electro-magnetic energy source
Issued on: 10/22/1991
Inventor: Dumoulin
5268573, System for detecting threshold phenomena associated with and/or atomic or molecular spectra of a substance
Issued on: 12/07/1993
Inventor: Weiss, et al.
5281814System for imaging and detecting threshold phenomena associated with and/or atomic or molecular spectra of a substance by reflection of an AC electrical signal
Issued on: 01/25/1994
Inventor: Weiss, et al.

International Class

H01J 037/20

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