U.S. patents available from 1976 to present.
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Small cavity analytical instruments

Patent 5559328 Issued on September 24, 1996. Estimated Expiration Date: Icon_subject July 29, 2014. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3566262

Absorption microscopy and/or spectroscopy with scanning tunneling microscopy control
Patent #: 4941753
Issued on: 07/17/1990
Inventor: Wickramasinghe

Scanning analysis and imaging system with modulated electro-magnetic energy source
Patent #: 5060248
Issued on: 10/22/1991
Inventor: Dumoulin

System for detecting threshold phenomena associated with and/or atomic or molecular spectra of a substance
Patent #: 5268573
Issued on: 12/07/1993
Inventor: Weiss, et al.

System for imaging and detecting threshold phenomena associated with and/or atomic or molecular spectra of a substance by reflection of an AC electrical signal Patent #: 5281814
Issued on: 01/25/1994
Inventor: Weiss, et al.

Inventors

Assignee

Application

No. 283007 filed on 07/29/1994

US Classes:

250/306, INSPECTION OF SOLIDS OR LIQUIDS BY CHARGED PARTICLES250/440.11, Analyte supports324/636With a resonant cavity

Examiners

Primary: Berman, Jack I.

Attorney, Agent or Firm

International Class

H01J 037/20

Abstract

A sample and the tip portion of an alternating current scanning tunneling microscope are electrically enclosed within a cavity with electrically conductive walls. The dimensions of the cavity are smaller than the wavelength of a component of the AC signal applied by the probe to the sample so that the output signal detected by the probe from the sample will not be contaminated by resonant effects of the cavity.

Other References

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