U.S. patents available from 1976 to present.
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Dram using word line potential control circuit

Patent 5550504 Issued on August 27, 1996. Estimated Expiration Date: Icon_subject May 10, 2014. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Address decoder circuit
Patent #: 4651031
Issued on: 03/17/1987
Inventor: Kamuro

Semiconductor memory device having improved write-verify operation
Patent #: 4737936
Issued on: 04/12/1988
Inventor: Takeuchi

Semiconductor memory device with voltage bootstrap
Patent #: 4769792
Issued on: 09/06/1988
Inventor: Nogami ,   et al.

Decoder driver circuit for programming high-capacitance lines
Patent #: 4820941
Issued on: 04/11/1989
Inventor: Dolby ,   et al.

High voltage switching circuit in a nonvolatile memory
Patent #: 4893275
Issued on: 01/09/1990
Inventor: Tanaka, et al.

Power supply switching circuit
Patent #: 4988894
Issued on: 01/29/1991
Inventor: Takiba, et al.

Semiconductor memory integrated circuit
Patent #: 5065361
Issued on: 11/12/1991
Inventor: Yoshizawa, et al.

Dynamic random access memory having improved word line control
Patent #: 5119334
Issued on: 06/02/1992
Inventor: Fujii

CMOS voltage level translator circuit Patent #: 5136190
Issued on: 08/04/1992
Inventor: Chern, et al.

Inventor

Application

No. 240368 filed on 05/10/1994

US Classes:

327/537, With field-effect transistor326/88, With capacitive or inductive bootstrapping327/543, Using field-effect transistor365/189.09, Including reference or bias voltage generator365/230.06Particular decoder or driver circuit

Examiners

Primary: Nelms, David C.
Assistant: Tran, Andrew Q.

Attorney, Agent or Firm

Foreign Patent References

  • 0092809 EP. 11/13/1983
  • 0212946 EP. 03/13/1987
  • 4117967 DE 12/13/1991
  • 5271141 JP 06/13/1977
  • 58188388 JP. 11/13/1983

International Classes

G05F 003/16
G11C 007/00

Foreign Application Priority Data

1990-09-12 JP

Abstract

Memory cells includes at least one memory cell having an n-channel MOS transistor and an n-channel MOS capacitor. A word line is connected to the memory cells. A word line drive circuit for driving the word line includes a p-channel MOS transistor for transferring a potential to the word line. The word line drive circuit is controlled by an output from a word line potential control circuit. The word line potential control circuit applies a power source potential to the word line through the current path of the p-channel MOS transistor in the word line drive circuit when the memory cells are not selected, and the word line potential control circuit applies a potential higher than a potential obtained by adding a threshold voltage of the n-channel MOS transistor to the power source potential to the word line through the current path of the p-channel MOS transistor in the word line drive circuit when the memory cells are selected.

Other References

  • Gillingham et al., "High-Speed, High-Reliability Circuit Design for Megabit DRAM", IEEE Journal of Solid-State Circuits, vol. 26, No. 8, Aug. 1991, pp. 1171-1175
  • Kitsukawa et al., "A 23-ns 1-Mb BiCMOS DRAM", IEEE Journal of Solid-State Circuits, vol. 25, No. 5, Oct. 1990,pp. 1102-110
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