U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Image detection device having correction circuit for removing artifacts due to delayed charge transfer

Patent 5530238 Issued on June 25, 1996. Estimated Expiration Date: Icon_subject September 1, 2014. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Charge coupled device image sensors
Patent #: 4742396
Issued on: 05/03/1988
Inventor: Bell

Recursive filter and image display apparatus including the same
Patent #: 5018179
Issued on: 05/21/1991
Inventor: Kaneko

Digital X-ray image read apparatus with a correction function
Patent #: 5083024
Issued on: 01/21/1992
Inventor: Takeda, et al.

Sensor matrix
Patent #: 5184018
Issued on: 02/02/1993
Inventor: Conrads, et al.

Radiation detector offset and afterglow compensation technique Patent #: 5331682
Issued on: 07/19/1994
Inventor: Hsieh

Inventors

Application

No. 299774 filed on 09/01/1994

US Classes:

250/208.1, Plural photosensitive image detecting element arrays250/370.09, X-ray or gamma-ray system348/250, In charge coupled type sensor378/98.8With solid-state image detector

Examiners

Primary: Westin, Edward P.
Assistant: Lee, John D.

Attorney, Agent or Firm

Foreign Patent References

  • 0422817 EP. 04/24/1991
  • 2178232 GB. 02/24/1987

International Classes

H04N 003/14
H04N 005/32

Foreign Application Priority Data

1993-09-03 EP

Abstract

An image detection device, notably a semiconductor image detection array for detecting x-ray images, is provided wherein perturbations due to phantom-images are substantially mitigated. In such an image detection array incident image carrying radiation is converted into charges. Delayed charge transfer due to trapping of charges in the semiconductor material of radiation sensor elements causes such perturbations. In an image detection device according to the invention a correction circuit is provided which is arranged to form an image correction signal being representative of delayed transferred charges. In a particular embodiment of an image detection device according to the invention the image correction signal is formed as a superposition of exponentially decaying signals of images which were detected before the detection of a currently detected image. An image signal containing artifacts due to delayed charge transfer is formed by a read-out circuit whereto charges formed by the radiation sensor elements are transferred. A corrected image signal is subsequently formed from the image correction signal and the signal formed by the multiplex circuit.

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