U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Three-dimensional scanning method for design of protheses

Patent 5522402 Issued on June 4, 1996. Estimated Expiration Date: Icon_subject May 13, 2014. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Method of forming implantable prostheses for reconstructive surgery
Patent #: 4436684
Issued on: 03/13/1984
Inventor: White

Prosthetic shape sensor
Patent #: 4819660
Issued on: 04/11/1989
Inventor: Smith

Apparatus for detecting abnormality of the spinal column
Patent #: 4832049
Issued on: 05/23/1989
Inventor: Matsushita ,   et al.

Apparatus and method for fitting a prosthesis socket Patent #: 5127420
Issued on: 07/07/1992
Inventor: Horvath

Inventor

Application

No. 242620 filed on 05/13/1994

US Classes:

600/595Body movement (e.g., head or hand tremor, motility of limb, etc.)

Examiners

Primary: Hindenburg, Max

Attorney, Agent or Firm

Foreign Patent References

  • 1683681 SU 10/13/1991

International Class

A61B 005/103

Abstract

A customized method and apparatus for the design and manufacture of a prosthesis utilizing optical surface mapping of the patient's residuum while the residuum is under pressure; conventional positioning software followed by other conventional software to produce a three dimensional representation; and utilizing conventional CAD/CAM procedures for further design modification and fabrication of the prosthesis. In the preferred embodiment, uniform and non-uniform elevated air pressures are used to simulate the shape that the residuum will take when the patient is walking. To accomplish this the patient's residuum is inserted into a pressure chamber that can be sealed around the patient's upper leg. Alternatively or in combination with the pressure within the chamber, a rubber sock or band may be used to apply pressure to selected areas of the residuum. Also located within the chamber is the equipment used to optically measure the residuum while it is under pressure. The preferred method and apparatus includes the utilization of a pulsed laser ranging system with movable ring mirrors to locate focal points along the residuum for the scan.

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