Patent 5504366 Issued on April 2, 1996. Estimated Expiration Date: September 13, 2013. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
A system for transporting in a vacuum chamber sample holders and samples between a holder tray and a location for use with a surface analytical instrument is disclosed. Also provided is a system including a microwave coaxial cable connecting the tip terminal of a scanning tunneling microscope to a microwave signal source and a system for clamping a heater to a sample holder in order to heat the sample.
"A Tunable Microwave Frequency Alternating Current Scanning Tunneling Microscope," by Stranick et al., Review of Scientific Instruments, vol. 65, No. 4, Apr. 1994, New York, pp. 918-921
"A Novel Ultrahigh Vacuum Scanning Tunneling Microscope for Surface Science Studies," by Haase et al., Review of Scientific Instruments, vol. 61, No. 5, May 1990, New York, pp. 1480-1483
Product brochure entitled "Surface/Interface Components Overview," Instruments and Materials for Surface and interface Analysis, Mountain View, CA pp. 5-16; Sep. 1, 1993
"AC Scanning Tunneling Microscopy and Spectroscopy," by Stranick et al., Version Date Aug. 28, 1992
"Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond . . . , " Betzig et al., Science, V. 25, pp. 189-195, Jul. 10, 1992
"Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale," Betzig et al., Science, V. 251, pp. 1468-1470, Mar. 22, 1991
"Super-Resolution Aperture Scanning Microscope," Weiss, Nature, V. 237, pp. 510-512, Jun. 10, 1972
"Scanning Surface Harmonic Microscopy: Scanning Probe Microscopy . . . , " Michel et al., Rev. Sci. Instrum., V. 63, No. 9, pp. 4080-4085, Sep. 1992