Abstract

A system for transporting in a vacuum chamber sample holders and samples between a holder tray and a location for use with a surface analytical instrument is disclosed. Also provided is a system including a microwave coaxial cable connecting the tip terminal of a scanning tunneling microscope to a microwave signal source and a system for clamping a heater to a sample holder in order to heat the sample.

Other References

• "A Tunable Microwave Frequency Alternating Current Scanning Tunneling Microscope," by Stranick et al., Review of Scientific Instruments, vol. 65, No. 4, Apr. 1994, New York, pp. 918-921
• "A Novel Ultrahigh Vacuum Scanning Tunneling Microscope for Surface Science Studies," by Haase et al., Review of Scientific Instruments, vol. 61, No. 5, May 1990, New York, pp. 1480-1483
• Product brochure entitled "Surface/Interface Components Overview," Instruments and Materials for Surface and interface Analysis, Mountain View, CA pp. 5-16; Sep. 1, 1993
• "AC Scanning Tunneling Microscopy and Spectroscopy," by Stranick et al., Version Date Aug. 28, 1992
• "Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond . . . , " Betzig et al., Science, V. 25, pp. 189-195, Jul. 10, 1992
• "Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale," Betzig et al., Science, V. 251, pp. 1468-1470, Mar. 22, 1991
• "Super-Resolution Aperture Scanning Microscope," Weiss, Nature, V. 237, pp. 510-512, Jun. 10, 1972
• "Scanning Surface Harmonic Microscopy: Scanning Probe Microscopy . . . , " Michel et al., Rev. Sci. Instrum., V. 63, No. 9, pp. 4080-4085, Sep. 1992
• "Nonlinear Alternating-Current Tunneling Microscopy," Kochanski, Physical review Letters, 62(19):2285-2288 (May 8, 1989)
• "Nonlinear Alternating-Current Tunneling Microscopy" (AT&T Preprint (Aug. 17, 1988), published in Phys. Rev. Ltrs, 62(19):2285-2288 (May 8, 1989)
• "Scanning Tunneling Microscopy at Microwave Frequencies," Ultramicroscopy, Seifert et al., pp. 42-44; 379-387 (1992)
• "Scanning Tunneling Microscopy at Microwave Frequencies," Ultramicroscopy, (Preprint, Korrigierte Version, Nov. 6, 1991), pp. 42-44; 379-387 (1992)
• "Scanning Tunneling Microscopy I," Anselmetti et al., pp. 5-6., Jul. 2, 1992
• "Laser-Frequency Mixing Using the Scanning Tunneling Microscope," Arnold et al. J. Vac. Sci. Technol., A, 6(2):466-469 (Mar./Apr. 1988)
• "Laser-Frequency Mixing in the Junction of a Scanning Tunneling Microscope," Appl. Phys. Lett., 51(11)786-788 (Sep. 14, 1987), Arnold et al
• "Laser-Driven Scanning Tunneling Microscope," Volcker et al., Phys. Rev. Lett., 66(13)1717-1720 (Apr. 1, 1991)
• "Scanning Tunneling Microscopy of Photoexcited Carriers at the Si (001) Surface," Cahill et al., J. Vac. Sci. Techn., B, 9(2):564-567 (Mar./Apr. 1991)
• "Atomically Resolved Carrier Recombination at Si(111)-(7×7) Surfaces," Hamers et al., Phys. Rev. Lett., 64(9):1051-1054 (Feb. 26, 1990)
• "Optical Interactions in the Junction of a Scanning Tunneling Microscope," Kuk et al., Phys. Rev. Lett., 65(4):456-459 (1990)
• "Optical Interactions in the Junction of a Scanning Tunneling Microscope," Kuk et al., Preprint published in Phys. Rev. Lett., 65(4):456-459 (1990)
• "Correlated Discrete Transfer of Single Electrons in Ultrasmall Tunnel Junctions," Likharev, IBM J. Res. Develop., 32(1):144-158 (Jan. 1988)
• "Single Electronics" Likharev et al., Scientific American, Jun. 1992
• "Ultramicroelectrodes: Cyclic Volammetry Above One Million Vs", J. Electro anal. Chem., 248:447-450 (1988)
• "High-Speed Cyclic Voltammetry," Wightman et al., Acc. Chem. Res., 23:64-70 (1990)
• "Single Charge Tunneling Coulomb Blockade Phenomena . . . , " Grabert et al., NATO ASI Series, Series B: Physics, vol. 294, pp. 1-19, 1992
• "Time-Correlated Single-Electron Tunneling in One-Dimensional Arrays of Ultrasmall . . . , " Delsing et al., Phys. Rev. Lett., 63(17):1861-1864, Oct. 23, 1989
• Wilson et al. "Imaging c₆₀ Clusters on a Surface using a Scanning Tunnelling Microscope" pp. 621-622; Dec. 13, 1990
• "A Versatile Microwave-Frequency-Compatible Scanning Tunneling Microscope," Stranick et al., Rev. Sci. Instrum., 64(5):1232-1234, May 1993
• "Coarse Tip Distance Adjustment and Positioner for a Scanning Tunneling Microscope," Frohn et al., Rev. Sci. Instrum., 60(6):1200-1201, Jun. 1989
• "Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications," edited by Binh et al., NATO ASI Series, V. 235, pp. 19-33
• Product brochure entitled"The Beetle STM-A Versatile, UHV Compatible Scanning Tunneling Microcope.
• "An Easily Operable Scanning Tunneling Microscope," Besocke, Surface Science, 181:145-153, 1987
• "Generation of Microwave Radiation in the Tunneling Junction of a Scanning Tunneling Microscope," by Krieger et al., The American Physical Society, vol. 41, No. 14, May 15, 1990, pp. 10229-10232
• "A New Impedance Spectrometer for the Investigation of Electrochemical Systems," by Pobkirov et al., Rev. Sci. Instrum., vol. 63, No. 11, pp. 5366-5372
• "Scanning Tunneling Microscopy, Resonant Tunneling, and Counting Electrons: A Quantum Standard of Current," by Guinea et al., Physical Review Letters, vol. 65, No. 3, pp. 281-284, Jul. 16, 199