Method for measuring a three-dimensional position of an object
Surface quality analyzer apparatus and method
Method and apparatus for monitoring the surface profile of a moving workpiece
Optical roller wave gauge Patent #: 5251010
ApplicationNo. 290811 filed on 10/03/1994
US Classes:356/604, Pattern is series of non-intersecting lines250/559.22Profile
ExaminersPrimary: Evans, F. L.
Attorney, Agent or Firm
Foreign Patent References
International ClassesG01B 011/30
Foreign Application Priority Data1992-02-18 GB
AbstractApparatus for measuring the shape of a surface of, for example, a metal strip moving over a support surface comprises a laser operable to direct onto the surface of the moving strip a plurality of light beams. From these laser-generated light beams a plurality of light patterns are produced each of which is scanned across the width of the strip and is spaced from the other light patterns in the direction of strip movement. An array of line-scan cameras extends across the width of the strip and is positioned to view and record the projected light patterns. Recorded data from the camera array is processed in parallel to provide a measure of the shape of the strip surface.