U.S. patents available from 1976 to present.
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Addressable shadow port and protocol for serial bus networks

Patent 5483518 Issued on January 9, 1996. Estimated Expiration Date: Icon_subject April 24, 2015. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

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Inventor

Assignee

Application

No. 427947 filed on 04/24/1995

US Classes:

370/241, DIAGNOSTIC TESTING (OTHER THAN SYNCHRONIZATION)324/73.1, PLURAL, AUTOMATICALLY SEQUENTIAL TESTS340/825.52, Addressing714/724, Digital logic testing714/730Addressing

Examiners

Primary: Olms, Douglas W.
Assistant: Patel, Ajit

Attorney, Agent or Firm

Foreign Patent References

  • 0417905A2 EP. 03/12/1991

International Class

G01R 031/28

Abstract

A protocol and associated circuitry operable for efficiently extending serial bus capability in system environments is described. The protocol is designed to coexist and be fully compatible with existing serial bus approaches, and in particular an example of application of the invention to a backplane system utilizing the 1149.1 IEEE standard serial bus is detailed. The circuitry and protocol required to couple any one of the boards on the backplane to the serial bus master without modifying the existing serial bus protocol, without adding additional signals, and without affecting the throughput rate of the serial bus is described. The invention advantageously allows the serial bus master to select, communicate with, and deselect backplane boards so that high level test functions may be simultaneously executed and monitored. Additional preferred embodiments are also described.

Other References

  • An Architecture for Extending the IEEE Standard 1149.1 Test Access Port to System Backplanes, by Dilip Bhavsar, International Test Conference 1991, pp. 768-776
  • Johann Maierhofer, "Hieerarchial Self-Test Concept based on the JTAG Standard," 1990 IEEE, 1990 International Test Conference, Paper 5.2, pp. 127-13
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