Current probe
Patent 5477135 Issued on December 19, 1995. Estimated Expiration Date: 
February 28, 2015. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
February 28, 2015. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3525041 Sensing system for measuring a parameter Circuit arrangement for testing the correct functioning of circuit(s) Current measuring method and apparatus therefor Current intensity transformer device for measuring a variable electric current Patent #: 5146156 InventorAssigneeApplicationNo. 396303 filed on 02/28/1995US Classes:324/130, Self-calibration324/117HHall effectExaminersPrimary: Nguyen, Viet Q.Attorney, Agent or FirmInternational ClassG01R 033/06AbstractA current probe comprising a Hall device and a secondary winding in a flux linking relationship with a magnetic circuit is self-calibrated by disconnecting the Hall device from the winding, passing a current through the winding so as to induce a magnetic flux in the magnetic circuit, measuring voltage developed by the Hall device in response to linking by the magnetic flux, calculating the Hall gain of the Hall device, and then adjusting the gain of a scaling output amplifier on the basis of the calculated Hall gain to compensate for variation in Hall gain due to changes in operating conditions.Field of SearchTESTING AND CALIBRATING ELECTRIC METERS (E.G., WATT-HOUR METERS)Transformer (e.g., split core admits conductor carrying unknown current) Magnetic saturation (e.g., in field or in amplifier) Hall effect Hall plate magnetometers With coupling means (e.g., attenuator, shunt) Self-calibration Hall effect | |
