Automated process planning for quality control inspection
Patent 5465221 Issued on November 7, 1995. Estimated Expiration Date: December 30, 2013. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
A computer is used for generating a part inspection plan for a coordinate measuring machine (CMM), in a feature-based rapid design system (RDS), having a Feature-Based Design Environment (FBDE), an Episodal Associative Memory (EAM), Fabrication Planning (FAB), and an Inspection Plan (INSP), with features which include form features (D1) which define the form or shape of the part, manufacturing features (D2), inspection features (D3), and geometric and design (GD&T) features (D4). The Inspection Plan (INSP) includes interaction means wherein the inspector interacts with the system to guide it to a desired result, and the inspector can define setups, measurement points, sequence for the points, and the via points. For the inspector's sequence input, a learning process is included, so that the inspector's desired sequence is sent to discovery means for organizing patterns and defining rules, which by recalling relevant past experiences, and learning from the inspector's input, creates a "self-improving" expert system.
Merat et al "Automated Inspection Planning within the Rapid Design System"; Proceeding of 1991 IEEE International Conference on System Engineering, Aug. 1991. pp. 42-48
Ruegsegger: "Intelligent Automated Process Planning and Code Generation for Computer-Controlled Inspection": Jan. 1993, pp. 1-135