Semiconductor device incorporating voltage reduction circuit therein
Patent 5463585 Issued on October 31, 1995. Estimated Expiration Date: 
April 14, 2014. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
April 14, 2014. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesStatic RAM including leakage current detector Patent #: 5132929 InventorAssigneeApplicationNo. 227796 filed on 04/14/1994US Classes:365/201, Testing365/154, Flip-flop (electrical)365/156, Complementary365/226, POWERING365/227, Conservation of power714/718Memory testingExaminersPrimary: Nelms, David C.Assistant: Hoang, Huan International ClassG11C 029/00Foreign Application Priority Data1993-04-14 JPAbstractA semiconductor device is disclosed which includes a storage area such as a RAM, a register, a latch, or a flip-flop. This device further includes a test mode detection circuit for detecting a test mode and a voltage control circuit for generating a power-down voltage that is lower than a power supply voltage supplied to the device, the power-down voltage being supplied to the storage area to test a data-hold characteristic thereof in the test mode. The power supply voltage is thereby free from being changed. | |
