U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Analog-digital converter with distributed sample-and-hold circuit

Patent 5444447 Issued on August 22, 1995. Estimated Expiration Date: Icon_subject December 28, 2013. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3710377

Analog to digital converter utilizing a quantizer network
Patent #: 4229729
Issued on: 10/21/1980
Inventor: Devendorf ,   et al.

Parallel analog-to-digital converter using 2.sup.(n-1) comparators
Patent #: 4928103
Issued on: 05/22/1990
Inventor: Lane

5117227

A/D convertor of the pipeline type having additional comparators for use in setting a specified reference voltage
Patent #: 5157398
Issued on: 10/20/1992
Inventor: Okazaki, et al.

Serial-parallel type analogue/digital converter
Patent #: 5159342
Issued on: 10/27/1992
Inventor: Yotsuyanagi

Pipelined A/D converter
Patent #: 5274377
Issued on: 12/28/1993
Inventor: Matsuura, et al.

Analog-to-digital conversion method and device Patent #: 5321402
Issued on: 06/14/1994
Inventor: Matsuzawa, et al.

Inventor

Assignee

Application

No. 174419 filed on 12/28/1993

US Classes:

341/156, Coarse and fine conversions341/159Parallel type

Examiners

Primary: Hoff, Marc S.

Attorney, Agent or Firm

Foreign Patent References

  • 0414389 EP. 02/13/1991
  • 0474567A1 EP. 03/13/1992

International Class

H03M 001/14

Foreign Application Priority Data

1992-12-30 FR

Abstract

The disclosure relates to analog-digital converters. It is sought to limit the power consumption and obtain a better compromise among the different performance characteristics of the computer. In a general structure of a converter there are, firstly, a coarse converter for the most significant bits and, secondly, a fine converter for the least significant bits. One of them, generally, the fine converter, has differential amplifiers [AD(1) to AD(N)]receiving the voltage to be converted (Ve) and a reference voltage. It is proposed to place sample-and-hold circuits [EB(1) to EB(N)] at output of these differential amplifiers and to eliminate the sample-and-hold circuit that is often placed upline with respect to these amplifiers.

Other References

  • I.E.E.E. Journal of Solid-State Circuits vol. SC-22, No. 6, Dec. 1987 New York pp. 944-953
  • Electronic Components & Applications vol. 8, No 3, 1988 Eindhoven, The Netherlands pp. 171-17
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