U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

High speed defect detection apparatus having defect detection circuits mounted in the camera housing

Patent 5440648 Issued on August 8, 1995. Estimated Expiration Date: Icon_subject August 8, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

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Non-woven fabric defect detecting device
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Raster input scanner
Patent #: 4433346
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Inventor: Stoffel ,   et al.

Data compression interface having parallel memory architecture
Patent #: 4546444
Issued on: 10/08/1985
Inventor: Bullis

Method for automatic optical inspection
Patent #: 4570180
Issued on: 02/11/1986
Inventor: Baier ,   et al.

Inspecting device for print
Patent #: 4685139
Issued on: 08/04/1987
Inventor: Masuda ,   et al.

System for monitoring and analysis of a continuous process
Patent #: 4752897
Issued on: 06/21/1988
Inventor: Zoeller ,   et al.

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Inventors

Assignee

Application

No. 794861 filed on 11/19/1991

US Classes:

382/141, Manufacturing or product inspection348/88, Web, sheet or filament348/133, With circuit detail356/430For flaws or imperfections

Examiners

Primary: Mancuso, Joseph
Assistant: Prikockis, Larry J.

Attorney, Agent or Firm

Foreign Patent References

  • 9114173 WO. 09/21/1991

International Classes

H04N 007/18
G01N 021/89

Abstract

A defect detection system includes a video camera with defect detection circuits for detecting defects in video signals being outputted by corresponding sections of an array sensor such as a TDI CCD two-dimensional array sensor. Each defect detection circuit includes a subtraction circuit for subtracting a prior stored pixel from an incoming pixel to generate a difference. Comparators compare the difference with positive and negative limits defining an acceptable range of difference values. The prior stored pixel is updated to the succeeding pixel only when the difference value is acceptable. Memories store the defect pixels from the respective detection circuits along with X-coordinates and end of line bits. The memories are sequentially read up to their end of line bits, and the defect pixel values along with coordinates expanded to include section indicating bits are transferred from the camera to further processing facilities.

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