U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Variable magnification color scanning light microscope

Patent 5430807 Issued on July 4, 1995. Estimated Expiration Date: Icon_subject December 14, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

2671128

3315229

3593284

3819913

3827804

3873974

3908078

Automatic focusing system including quantizing means
Patent #: 4012634
Issued on: 03/15/1977
Inventor: Bouton ,   et al.

Automatic focusing system
Patent #: 4045772
Issued on: 08/30/1977
Inventor: Bouton ,   et al.

Pattern recognition system with keyboard entry for adaptive sensitivity
Patent #: 4048616
Issued on: 09/13/1977
Inventor: Hart ,   et al.

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Inventor

Assignee

Application

No. 990030 filed on 12/14/1992

US Classes:

382/128, Biomedical applications348/79, Microscope382/322Single spot

Examiners

Primary: Razavi, Michael
Assistant: Prikockis, Larry J.

Attorney, Agent or Firm

International Class

H04N 005/30

Abstract

An improved imaging system operates at the diffraction limit of the optics to which it is connected and outputs a signal representative of the sample lying in the sample plane. The imaging system comprises a cathode ray tube, an optical lens system and a means for sensing. The cathode ray tube comprises an electron gun for generating an electron beam in a raster pattern. The raster pattern comprises a predetermined number of horizontal lines that are spaced vertically from each other a predetermined and equal distance. The electron beam is adapted to produce an illuminated spot that scans correspondingly in the raster pattern and wherein the spot is positioned in an object plane. The optical lens system for focusing in a diffraction limited manner, the object plane on to the sample plane, such that the image of the spot is the smallest diffraction limited size as determined by the optical lens system. The imaging system also includes zoom and contrast enhancement/suppression capabilities.

Other References

  • Wilson, "Scanning Optical Microscopy" IEEE Electrotechnology Review, vol. 2, pp. 101-103, 1986
  • Hecht, "Optics", Addison Wesley Co. 1987 pp. 128-129
  • "The Scanning Optical Microscope", T. Wilson IEE DN A79021809 26pages, 197
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