U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Surface emitting photonic switching structure

Patent 5424559 Issued on June 13, 1995. Estimated Expiration Date: Icon_subject June 6, 2014. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Light emitting semiconductor device
Patent #: 4845535
Issued on: 07/04/1989
Inventor: Yamanishi ,   et al.

Electrically pumped vertical cavity laser
Patent #: 4991179
Issued on: 02/05/1991
Inventor: Deppe, et al.

Optical semiconductor device
Patent #: 5084894
Issued on: 01/28/1992
Inventor: Yamamoto

Wavelength-tunable distributed Bragg reflector semiconductor laser
Patent #: 5157681
Issued on: 10/20/1992
Inventor: Aoyagi, et al.

Integration of transistors with vertical cavity surface emitting lasers Patent #: 5283447
Issued on: 02/01/1994
Inventor: Olbright, et al.

Inventor

Assignee

Application

No. 254274 filed on 06/06/1994

US Classes:

257/21, Light responsive structure257/22, With specified semiconductor materials257/85, With heterojunction257/98, With reflector, opaque mask, or optical element (e.g., lens, optical fiber, index of refraction matching layer, luminescent material layer, filter) integral with device or device enclosure or package257/184, Light responsive structure359/248Semiconductor

Examiners

Primary: Mintel, William

Attorney, Agent or Firm

Foreign Patent References

  • 63-147387 JP. 06/21/1988
  • 63-25335 JP. 10/21/1988
  • 0159980 JP. 03/21/1989

International Class

H01L 027/14

Foreign Application Priority Data

1993-06-11 JP

Abstract

A surface emitting photonic switching structure includes an intermediate semiconductor structure having pn junction is sandwiched between a first semiconductor multi-layer film mirror (DBR1) and a second semiconductor multi-layer film mirror (DBR2). A pair of electrodes are provided to the intermediate semiconductor structure and the pn junction therein is applied with reverse bias voltages for changing the effective optical length of the intermediate semiconductor structure so as to change transmission wavelength of light incident on the second multi-layer film mirror or the first multi-layer film mirror. The structure can be two-dimensionally integrated, be compact and is capable of operating with low voltages.

Other References

  • "Continuous Wavelength Tuning of Two-Electrode Vertical Cavity Surface Emitting Lasers" Electronics Letters, 23 May 1991, vol. 27, No. 11, pp. 1002-1003
  • "Photonic Switching" 1991 Technical Digest Series, Mar. 6-8, 1991, Salt Lake City, Utah, pp. 246-24
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