System and method for on-line monitoring and control of heavy metal contamination in soil washing process
Patent 5414195 Issued on May 9, 1995. Estimated Expiration Date: 
June 17, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
June 17, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 2781453 3204097 3443092 3723727 3781556 3832545 3889112 Method and apparatus for the in situ analysis of marine ore concretions Apparatus for quantitative in-line X-ray fluorescence analysis of slurries X-ray analytical system Inventors
AssigneeApplicationNo. 899962 filed on 06/17/1992US Classes:588/1, DESTRUCTION OR CONTAINMENT OF RADIOACTIVE WASTE209/576, Sensing radiant energy reflected, absorbed, emitted, or obstructed by item or adjunct thereof209/577, Infrared, visible light, or ultraviolet209/578, Ultraviolet209/579, Laser209/589, X-ray or gamma ray376/157, Gamma or charged particle activation analysis376/159, Neutron activation analysis378/53, Composition analysis378/88, Composition analysis422/50, ANALYZER, STRUCTURED INDICATOR, OR MANIPULATIVE LABORATORY DEVICE422/62, Automatic analytical monitor and control of industrial process422/68.1, Means for analyzing liquid or solid sample422/186, With means applying electromagnetic wave energy or corpuscular radiation to reactants for initiating or perfecting chemical reaction588/900APPARATUSExaminersPrimary: Walsh, Donald P.Assistant: Jenkins, Daniel J. International ClassesG21F 009/00B07C 005/34 AbstractThe concentrations of residual heavy metal contaminants in the particulate material in a slurry produced in a particulate material washing process are monitored on-line and can be used to control the washing process. In alternative embodiments of the invention, x-rays, thermal neutrons or laser beams are directed at the slurry as it flows through a flow cell to induce emission of secondary x-rays, gamma rays or light, respectively, characteristic of the heavy metal contaminants and constituents representative of the solids contents of the slurry. These characteristic energies are measured and used to determine the concentration in ppm of the residual heavy metal contaminants in the particulate material within the slurry.Other References
Field of SearchWith means applying electromagnetic wave energy or corpuscular radiation to reactants for initiating or perfecting chemical reactionANALYZER, STRUCTURED INDICATOR, OR MANIPULATIVE LABORATORY DEVICE Automatic analytical monitor and control of industrial process Means for analyzing liquid or solid sample APPARATUS DESTRUCTION OR CONTAINMENT OF RADIOACTIVE WASTE Composition analysis Composition analysis Sensing radiant energy reflected, absorbed, emitted, or obstructed by item or adjunct thereof Infrared, visible light, or ultraviolet Ultraviolet Laser X-ray or gamma ray SPECIAL APPLICATIONS | |
