Parallel plate dielectric constant measuring apparatus having means for preventing sample deformation

Patent 5389884 Issued on February 14, 1995. Estimated Expiration Date:

May 7, 2013. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Abstract Claims Description Full Text

Patent References

3450988

Method and apparatus employing thin conductive films on flexible nonconductive sheets for non-destructive measurement of electrical characteristics
Patent #: 3942107
Issued on: 03/02/1976
Inventor: Gerhard

Device for measuring the water content of ink samples
Patent #: 4658207
Issued on: 04/14/1987
Inventor: Scribano , et al.

Ventilation pane assembly Patent #: 5120273
Issued on: 06/09/1992
Inventor: Lin

Inventors

Assignee

Seiko Instruments Inc.

Application

No. 057766 filed on 05/07/1993

US Classes:

324/663, Where a material or object forms part of the dielectric being measured73/61.41, Content or effect of a constituent of a liquid mixture324/688Including a guard or ground electrode

Examiners

Primary: Strecker, Gerard R.
Assistant: Do, Diep

Attorney, Agent or Firm

Spensley Horn Jubas & Lubitz

Foreign Patent References

1271524 CA. 07/12/1990
2093196 GB. 08/12/1982

International Classes

G01R 027/26
G01N 027/22

Foreign Application Priority Data

1992-05-07 JP

Abstract

In order to measure a complex dielectric constant, a sample 8 enveloped by a ring 9 and two laminas 10 is inserted between parallel plate electrodes constituted by an exciting electrode 2 and a response electrode 3. Measuring data is obtained as a measuring value of the sample 8 itself because an operational circuit 21 removes parasitic effects of the ring 9 and the lamina 10. Dielectric characteristics of a fluid sample can be obtained readily and accurately without contaminating the electrodes.