Measurement-diverse speckle imaging
April 12, 2013. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesWavefront sensing by phase retrieval Wave front sensor Laser wavefront measurement device utilizing crossed Ronchi gratings Adaptive optics system and method Electronically phased detector arrays for optical imaging Apparatus for sensing wavefront aberration Wide FOV retro-null outgoing wavefront sensor Real-scene dispersion sensor detecting two wavelengths and determining time delay Scanning scene-based wavefront sensor having a linear image sensor array and a pupil sensor array Patent #: 5300766 InventorApplicationNo. 046094 filed on 04/12/1993US Classes:250/201.9, Light beam wavefront phase adaptation356/121LAMP BEAM DIRECTION OR PATTERNExaminersPrimary: Nelms, David C.Assistant: Lee, John D. Attorney, Agent or FirmInternational ClassG01J 001/20AbstractA method and apparatus for obtaining fine resolution imaging of extended objects in the presence of unknown time-varying aberrations, wherein the method is accomplished by obtaining data corresponding to multiple, measurement-diverse images of the extended object collected for each of a plurality of aberration realizations. The object and unknown aberrations are then Jointly estimated, preferably using constrained likelihood-based estimation techniques. The apparatus utilizes a conventional optical system, at least two detector arrays for detecting a plurality of phase-diverse images, a shutter system so that a specklegram can be captured at each of the phase-diverse arrays for each of a plurality of aberration realizations, and a computer including a processor, sufficient memory restoring the digital data corresponding to the captured images, and logic for estimating the object and unknown aberrations.Other References
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