Examination of subjects using photon migration with high directionality techniques
Patent 5353799 Issued on October 11, 1994. Estimated Expiration Date: 
June 17, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
June 17, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesMethod and apparatus to monitor cholesterol levels with photon correlation spectroscopy Oximeter with system for testing transmission path In vivo fluorescence photometer Phase modulated spectrophotometry Method and arrangement for depicting structures Imaging process and system for transillumination with photon frequency marking Frequency domain optical imaging using diffusion of intensity modulated radiation Patent #: 5213105 InventorAssigneeApplicationNo. 900197 filed on 06/17/1992US Classes:600/473, Infrared radiation356/319, Utilizing a spectrophotometer (i.e., plural beam)600/476Visible light radiationExaminersPrimary: Sykes, Angela D.Attorney, Agent or FirmInternational ClassA61B 005/00AbstractA method and system for examination of a subject positioned between input and detection ports of the spectroscopic system applied to the subject. The systems shown include at least one light source for introducing at one or multiple input ports, electromagnetic non-ionizing radiation of a known time-varying pattern of photon density of a wavelength selected to be scattered and absorbed while migrating in the subject, radiation pattern control means for achieving a directional pattern of emitted resulting radiation that possesses substantial gradient of photon density, at least one detector for detecting the radiation that has migrated in the subject at one or multiple detection ports. The systems also include processing means for processing the detected radiation and creating sets of data, and evaluation means for examining the subject using the data sets. The emitted directional radiation pattern utilizes its gradient of photon density to detect a hidden object while scanning across the examined subject. The wavelength of the radiation can be selected to be sensitive to endogenous or exogenous pigments, or to cause fluorescent emission from a fluorescent constituent of interest in the subject. The operation of the systems is computer controlled.Other References
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