U.S. patents available from 1976 to present.
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Method and apparatus for optical imaging with means for controlling the longitudinal range of the sample

Patent 5321501 Issued on June 14, 1994. Estimated Expiration Date: Icon_subject April 29, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Multiple-point temperature sensor using optic fibers
Patent #: 4928005
Issued on: 05/22/1990
Inventor: Lefevre, et al.

Polarization independent optical coherence-domain reflectometry Patent #: 5202745
Issued on: 04/13/1993
Inventor: Sorin, et al.

Inventors

Application

No. 875670 filed on 04/29/1992

US Classes:

356/479, Having a short coherence length source250/227.27, With coherent interferrometric light356/73.1FOR OPTICAL FIBER OR WAVEGUIDE INSPECTION

Examiners

Primary: Turner, Samuel A.
Assistant: Keesee, LaCharles P.

Attorney, Agent or Firm

International Class

G01B 009/02

Abstract

A method and apparatus for performing optical imaging on a sample wherein longitudinal scanning or positioning in the sample is provided by either varying relative optical path lengths for an optical path leading to the sample and to a reference reflector, or by varying an optical characteristic of the output from an optical source applied to the apparatus. Transverse scanning in one or two dimensions is provided on the sample by providing controlled relative movement between the sample and a probe module in such direction and/or by steering optical radiation in the probe module to a selected transverse position. The probe module may be an external module or may be an endoscope or angioscope utilized for scanning internal channels. Multiple optical paths may be provided for parallel scanning and focus may be enhanced by varying the focal point in the sample in synchronism with longitudinal scanning of the sample.

Other References

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  • Kobayashi & Noda, "Polarization-independent . . . inferometry", Journal of Lightwave Technology 9, 0733-8724, May 199
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