U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Measurement of fiber diameters with high precision

Patent 5309221 Issued on May 3, 1994. Estimated Expiration Date: Icon_subject December 31, 2011. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Method for measuring the parameters of optical fibers
Patent #: 3982816
Issued on: 09/28/1976
Inventor: Watkins

Method and apparatus for determining ratio of core radius to cladding radius in clad optical fibers
Patent #: 4027977
Issued on: 06/07/1977
Inventor: Frazee, Jr. ,   et al.

Monitoring and control of optical fiber diameters
Patent #: 4046536
Issued on: 09/06/1977
Inventor: Smithgall, Sr.

Method for measuring the parameters of optical fibers
Patent #: 4067651
Issued on: 01/10/1978
Inventor: Watkins

Method and apparatus for detection of inclusions in glass article or the like
Patent #: 4136961
Issued on: 01/30/1979
Inventor: Young, II

Methods and apparatus for improving the resolution of measured parameters
Patent #: 4176961
Issued on: 12/04/1979
Inventor: Frazee, Jr. ,   et al.

System for measuring optical waveguide fiber diameter
Patent #: 4280827
Issued on: 07/28/1981
Inventor: Murphy ,   et al.

Method of observing the core region of optical fibers and preforms
Patent #: 4307296
Issued on: 12/22/1981
Inventor: Presby

Manufacture of concentric coatings for fiber waveguides
Patent #: 4363827
Issued on: 12/14/1982
Inventor: Eichenbaum

Method for testing specimens
Patent #: 4501492
Issued on: 02/26/1985
Inventor: Douklias

More ...

Inventors

Assignee

Application

No. 816882 filed on 12/31/1991

US Classes:

356/496, For dimensional measurement356/73.1, FOR OPTICAL FIBER OR WAVEGUIDE INSPECTION356/503, Thickness356/635Width or diameter

Examiners

Primary: Turner, Samuel A.

Attorney, Agent or Firm

International Class

G01B 009/02

Abstract

Methods for measuring the diameters of transparent filaments with high precision, e.g., RMS standard deviations of less than 0.02 microns, are provided. The methods involve determining the average spatial frequency ω of the far-field interference pattern produced by illuminating the filament with a beam of laser light. The average spatial frequency is determined by performing a fast Fourier transform (FFT) on the interference data to obtain a coarse estimate for the average and then performing a set of discrete sequence Fourier transforms (DSFTs) in the region of the coarse estimate to obtain the desired high precision estimate of the average. Efficient on-line processing procedures are provided so that real time measurements can be performed on, for example, a moving optical waveguide fiber, at rates of 500 measurements/second and above.

Other References

  • "Measurement of Optical Fiber Diameter Using the Fast Fourier Transform", Mustafa A. G. Abushagur and Nicholas George, Applied Optics, Jun. 15, 1980, vol. 19, No. 12, pp. 2031-2033
  • "Outer Diameter Measurement of Low Birefringence Optical Fibers by a New Resonant Backscatter Technique", A. Ashkin, J. M. Dziedzic and R. H. Stolen, Applied Optics, Jul. 1, 1981, vol. 20, No. 13, pp. 2299-230
PatentsPlus Images
Enhanced PDF formats
loading...
PatentsPlus: add to cart
PatentsPlus: add to cartSearch-enhanced full patent PDF image
$9.95more info
PatentsPlus: add to cart
PatentsPlus: add to cartIntelligent turbocharged patent PDFs with marked up images
$16.95more info
 
Sign InRegister
Username  
Password   
forgot password?