Scratch measurement apparatus and method
Patent 5283642 Issued on February 1, 1994. Estimated Expiration Date: 
March 16, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
March 16, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesMethod and apparatus for determining physical characteristics of objects and object surfaces New photodetector array based optical measurement systems Panel surface flaw inspection Vision metrology system Method for evaluating smooth surfaces Method and apparatus for assessing surface roughness Patent #: 4878114 InventorAssigneeApplicationNo. 852027 filed on 03/16/1992US Classes:348/135, Object or scene measurement73/105, Roughness348/128Of surface (e.g., texture or smoothness, etc.)ExaminersPrimary: Britton, Howard W.Attorney, Agent or FirmForeign Patent References
International ClassH04N 007/18AbstractA scratch measurement system employs a class I or class II laser and digital signal processing in conjunction with a vision system to measure scratch depth. Video data acquired by a vision system is processed to determine threshold values wherein the scratch surface is detected and scratch depth computed. Hard copy graphic results as well as numerical scratch depth measurements are provided on a printer. The unit may be calibrated to a certifiable standard and is provided in a low-cost portable package, suitable for use in manufacturing and repair situations as well as in the laboratory.Other References
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