U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Method and device for measuring temperature radiation using a pyrometer wherein compensation lamps are used

Patent 5271084 Issued on December 14, 1993. Estimated Expiration Date: Icon_subject October 6, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

2611541

3358974

3376748

3462224

3796099

3884075

3916690

Thermal reference apparatus
Patent #: 4433924
Issued on: 02/28/1984
Inventor: Quinn, III

Method of and an apparatus for measuring surface temperature and emmissivity of a heated material
Patent #: 4465382
Issued on: 08/14/1984
Inventor: Iuchi ,   et al.

Pyrometer #2
Patent #: 4647774
Issued on: 03/03/1987
Inventor: Brisk ,   et al.

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Inventors

Assignee

Application

No. 957443 filed on 10/06/1992

US Classes:

392/416, With chamber219/411, With infrared generating means356/43, OPTICAL PYROMETERS374/123, Transparent material measurement or compensation (e.g., spectral line, gas, particulate suspension374/126, Having emissivity compensating or specified radiating surface374/161Change of optical property

Examiners

Primary: Cuchlinski, William A. Jr.
Assistant: Gutierrez, Diego

Attorney, Agent or Firm

Foreign Patent References

  • 8701479 NL. 01/13/1989

International Classes

A21B 002/00
F26B 019/00
G01J 005/00
G01J 005/10

Foreign Application Priority Data

1990-05-23 NL

Abstract

Method and apparatus for measuring the radiation originating from one side of a wafer of semiconductor material using a pyrometer, wherein non-blackbody compensation radiation is projected onto that side to compensate for the reflectivity of the wafer of material and wherein the intensity of the non-blackbody compensation radiation is controlled subject to the amount of radiation measured by the pyrometer.

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