Celebrity Inventors
Mark Twain (Samuel L. Clemens) received Patent No. 121,992 for "An Improvement in Adjustable and Detachable Straps for Garments." He later received two more patents: one for a self-pasting scrapbook and one for a game to help players remember important historical dates.
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US Patent 5270643 - Pulsed laser photoemission electron-beam probe
US Patent Issued on December 14, 1993
Estimated Patent Expiration Date:
August 12, 2012Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
Estimated Patent Expiration Date:
August 12, 2012Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.AbstractAn electron-beam test probe system (400) in which a pulsed laser-beam source (404) and a photocathode assembly (430) are used with an electron-beam column (426) to produce a pulsed electron beam at a stabilized repetition frequency. A pulse picker (414) allows the pulse repetition frequency of the pulsed electron beam to be reduced to a submultiple of the pulsed laser repetition frequency. A test pattern generator (416) is programmable to apply a desired pattern of test vector patterns to an electronic circuit to be probed, the test vector patterns being synchronized with the stabilized laser-beam pulse repetition frequency. A timebase circuit (412) allows the test vector patterns to be time-shifted relative to the pulsed electron beam. The electronic circuit under test can thus be probed at any desired point in the applied test vector pattern by control of the pulse picker and by time-shifting the test vector pattern.Other References
| InventorsAssigneeApplicationNo. 928919 filed on 08/12/1992US Classes:324/751, Using electron beam probe324/73.1, PLURAL, AUTOMATICALLY SEQUENTIAL TESTS324/96Using radiant energyField of Search324/73.1, PLURAL, AUTOMATICALLY SEQUENTIAL TESTS324/96, Using radiant energy250/310, Electron probe type250/311, Electron microscope type250/493.1, RADIANT ENERGY GENERATION AND SOURCES250/492.1, IRRADIATION OF OBJECTS OR MATERIAL250/492.2, Irradiation of semiconductor devices250/492.3, Ion or electron beam irradiation356/364, BY POLARIZED LIGHT EXAMINATION356/401, With registration indicia (e.g., scale)356/367Including polarimetersExaminersPrimary: Nguyen, Viet Q.Attorney, Agent or FirmUS Patent References3796947, 4862075, High frequency test head using electro-opticsIssued on: 08/29/1989 Inventor: Choi , et al.4875006, Ultra-high-speed digital test system using electro-optic signal sampling Issued on: 10/17/1989 Inventor: Henley, et al.4963823, Electron beam measuring instrument Issued on: 10/16/1990 Inventor: Otto, et al.5095262, Electro-optic sampling system clock and stimulus pattern generator Issued on: 03/10/1992 Inventor: Henley, et al.5157327, Method and apparatus for electro-optically measuring a voltage signal Issued on: 10/20/1992 Inventor: Henley5170127Capacitance imaging system using electro-optics Issued on: 12/08/1992 Inventor: Henley Foreign Patent References
International ClassG01R 027/26 |
