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System for detecting threshold phenomena associated with and/or atomic or molecular spectra of a substance

Patent 5268573 Issued on December 7, 1993. Estimated Expiration Date: Icon_subject July 17, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Inventors

Assignee

Application

No. 916165 filed on 07/17/1992

US Classes:

250/306, INSPECTION OF SOLIDS OR LIQUIDS BY CHARGED PARTICLES204/400, Analysis and testing204/412, Three or more electrodes205/775, ELECTROLYTIC ANALYSIS OR TESTING (PROCESS AND ELECTROLYTE COMPOSITION)250/307Methods

Examiners

Primary: Berman, Jack I.

Attorney, Agent or Firm

International Class

H01J 037/28

Abstract

A microwave sweep oscillator is used to apply an AC signal cross a scanning tunneling microscope and the current or voltage passing between the electrodes is measured by a microwave spectrum/network analyzeThis invention was made with support from the National Science Foundation, United States Government, under Grant No. CHE-9158375. The government has rights in this invention.

Other References

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  • R. Hamers et al., "Atomically Resolved Carrier Recombination at Si (111)--(7×7) Surfaces," Phys. Rev. Lett., 64(9):1051-1054 (Feb. 26, 1990)
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  • K. Likharev, "Correlated Discrete Transfer of Single Electrons in Ultrasmall Tunnell Junctions," IBM J. Res. Develop., 32(1):144-158 (Jan. 1988)
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  • C. Andrieux et al., "Ultramicroelectrodes: Cyclic Voltammetry Above One Million V s1 ", J. Electroanal. Chem., 248:447-450 (1988)
  • R. Wightman et al., "High-Speed Cyclic Voltammetry," Acc. Chem. Res., 23:64-70 (1990
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