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Method of fabricating an integrated circuit for providing low-noise and high-power microwave operation

Patent 5254492 Issued on October 19, 1993. Estimated Expiration Date: Icon_subject November 10, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

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4952527

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Inventors

Assignee

Application

No. 973906 filed on 11/10/1992

US Classes:

438/172, Having heterojunction (e.g., HEMT, MODFET, etc.)257/E21.697, Substrate is Group III-V semiconductor (EPO)257/E21.698, Substrate is Group II-VI semiconductor (EPO)257/E27.012, Made of compound semiconductor material, e.g. III-V material (EPO)257/E27.068, Schottky barrier gate field-effect transistor (EPO)438/576Into grooved or recessed semiconductor region

Examiners

Primary: Hearn, Brian E.
Assistant: Trinh, Michael

Attorney, Agent or Firm

Foreign Patent References

  • 3179752 JP 08/22/1991

International Class

H01L 021/70

Abstract

Generally, and in one form of the invention, an integrated circuit is disclosed for providing low-noise and high-power microwave operation comprising: an epitaxial material structure comprising a substrate 10, a low-noise channel layer 14, a low-noise buffer layer 16, a power channel layer 18, and a moderately doped wide bandgap layer 20; a first active region 24 comprising a first source contact 32 above the wide bandgap layer 22, a first drain contact 36 above the wide bandgap layer 22, wherein the first source contact 32 and the first drain contact 36 are alloyed and thereby driven into the material structure to make contact with the low-noise channel layer 14, and a first gate contact 28 to the low-noise buffer layer 16; and a second active region 26 comprising a second source contact 34 above the wide bandgap layer 22, a second drain contact 38 above the wide bandgap layer 22, wherein the second source contact 34 and the second drain contact 38 are alloyed and thereby driven into the material structure to make contact with the power channel layer 18, and a second gate contact 30 to the wide bandgap layer 22; wherein the first active region 24 and the second active region 26 are electrically isolated from one another, and whereby the integrated circuit is formed with all epitaxial layers formed during a single epitaxial growth cycle and is capable of providing low-noise, high-power, and switching operation at microwave frequencies.

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