U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Bias ECR plasma CVD apparatus comprising susceptor, clamp, and chamber wall heating and cooling means

Patent 5254171 Issued on October 19, 1993. Estimated Expiration Date: Icon_subject April 13, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Plasma apparatus
Patent #: 4902934
Issued on: 02/20/1990
Inventor: Miyamura, et al.

Low-temperature plasma processor
Patent #: 5078851
Issued on: 01/07/1992
Inventor: Nishihata, et al.

Plasma treating method and apparatus therefor
Patent #: 5085750
Issued on: 02/04/1992
Inventor: Soraoka, et al.

Novel susceptor for use in chemical vapor deposition apparatus and its method of use Patent #: 5091208
Issued on: 02/25/1992
Inventor: Pryor

Inventors

Assignee

Application

No. 867516 filed on 04/13/1992

US Classes:

118/723MR, With magnet (e.g., electron cyclotron resonance, etc.)118/724, By means to heat or cool118/725, Substrate heater118/728Work support

Examiners

Primary: Hearn, Brian E.
Assistant: Baskin, Jonathan D.

Attorney, Agent or Firm

Foreign Patent References

  • 61-247696 JP. 11/18/1986
  • 63-185891 JP. 08/18/1988
  • 63-265890 JP. 11/18/1988
  • 1-36085 JP. 05/18/1989
  • 1-235259 JP. 09/18/1989
  • 2-228035 JP. 09/18/1990

International Classes

C23C 016/00
C23C 016/50

Foreign Application Priority Data

1991-04-16 JP

Abstract

A bias ECR plasma CVD apparatus includes an ECR plasma generating chamber and a plasma CVD chamber for forming a film on a substrate by a plasma CVD reaction. A heating device and a cooling device are provided at least in the vicinity of the substrate for maintaining the substrate and the vicinity thereof at a constant temperature. With this construction, the number of contaminant particles deposited on a surface of the substrate in forming the film on the substrate can be reduced.

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