U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Micromechanical structure

Patent 5252294 Issued on October 12, 1993. Estimated Expiration Date: Icon_subject February 3, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Method for the production of semiconductor devices with an integral heatsink and of related semiconductor equipment
Patent #: 3973320
Issued on: 08/10/1976
Inventor: Greco ,   et al.

Liquid transport device and method
Patent #: 4233029
Issued on: 11/11/1980
Inventor: Columbus

Micromechanical elements and methods for their fabrication
Patent #: 4740410
Issued on: 04/26/1988
Inventor: Muller ,   et al.

Scanning device for microline-by-microline illumination and optically scanning a planar original
Patent #: 4778989
Issued on: 10/18/1988
Inventor: Hagemayer ,   et al.

Microelectrochemical sensor and sensor array
Patent #: 4874500
Issued on: 10/17/1989
Inventor: Madou, et al.

Monolithic fabrication techniques for front face optoelectronic couplers and/or optical components including ridge structured waveguides Patent #: 4895615
Issued on: 01/23/1990
Inventor: Muschke

Inventors

Assignee

Application

No. 830755 filed on 02/03/1992

US Classes:

422/102, Container257/E27.006, Including piezo-electric, electro-resistive, or magneto-resistive component (EPO)422/63, Sample mechanical transport means in or for automated analytical system422/68.1, Means for analyzing liquid or solid sample422/82.11, Waveguides422/943, Specially adapted for heating or cooling samples [B01L 3/00C2D2]435/288.4Including multiple compartments (e.g., wells, etc.)

Examiners

Primary: Warden, Robert J.
Assistant: Trembley, T. A.

Attorney, Agent or Firm

Foreign Patent References

  • 0250948 EP. 06/13/1987
  • 3613181 DE. 10/13/1987
  • 3634573 DE. 10/13/1987
  • 3602796 DE. 01/13/1988
  • 3619778 DE. 01/13/1988
  • 3701295 DE. 09/13/1988
  • 3715674 DE. 12/13/1988
  • 3804200 DE. 08/13/1989
  • 3804751 DE. 08/13/1989
  • 3811052 DE. 08/13/1989
  • 3817153 DE. 11/13/1989

International Classes

G01N 021/00
C12M 001/00

Foreign Application Priority Data

1988-06-01 DE

Abstract

A micromechanical structure with cavities, containers, openings, canals, depressions, humps or the like for examinations of sample substances for possible changes of physical and/or chemical properties with targeted evaluation and documentation for the purposes of biotechnology, gene technology, cell and immune research and other medical, agricultural and environment research, where the structure consists of semiconducting material (of the group III to V of the elements of the periodic system) or contain the latter or glass or ceramic, diamond, or carbon and is made by a masking technique, especially by a chemical etching technique.

Other References

  • Angell et al., "Silicon Micromechanical Devices", Apr. 1983, pp. 44-55
  • Laser and Optoelectronik, No. 4, 1986, pp. 323-336
  • W. A. Little, AIP Proceedings for Future Trends in Superconductive Electronics, p. 421, 197
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