U.S. patents available from 1976 to present.
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Method of and apparatus for inspecting end of object for defect

Patent 5249034 Issued on September 28, 1993. Estimated Expiration Date: Icon_subject January 15, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Dual wavelength spectrophotometer for ampoule leak detection and content inspection
Patent #: 4300689
Issued on: 11/17/1981
Inventor: Franklin ,   et al.

Shape testing apparatus
Patent #: 4343553
Issued on: 08/10/1982
Inventor: Nakagawa ,   et al.

Foreign matter detecting device
Patent #: 4376951
Issued on: 03/15/1983
Inventor: Miyazawa

Defect detecting method and apparatus
Patent #: 4492476
Issued on: 01/08/1985
Inventor: Miyazawa

Defect detecting method and system
Patent #: 4606635
Issued on: 08/19/1986
Inventor: Miyazawa ,   et al.

Apparatus for inspecting bottles
Patent #: 4650326
Issued on: 03/17/1987
Inventor: Nagamine ,   et al.

Process and apparatus for the automatic inspection by transparency contrast in particular of containers Patent #: 4736851
Issued on: 04/12/1988
Inventor: Ricros ,   et al.

Inventor

Assignee

Application

No. 820975 filed on 01/15/1992

US Classes:

356/606, Line of light projected209/526, Detecting internal flaw (e.g., air bubble, crack, etc.) in wall of item250/223B, Bottles348/125, Flaw detector356/239.4, Containers (e.g., bottles)356/394With comparison to master, desired shape, or reference voltage

Examiners

Primary: Rosenberger, Richard A.
Assistant: Pham, Hoa Q.

Attorney, Agent or Firm

Foreign Patent References

  • 1-129112 JP. 05/13/1989
  • 2096763 GB 02/13/1982

International Classes

G01B 011/14
G01N 021/00

Foreign Application Priority Data

1991-01-29 JP

Abstract

A method of and an apparatus for inspecting an end of an object for a defect by which not only a defect caused by deformation of an end of an object in a horizontal direction but also another defect caused by deformation in a vertical direction can be detected with a high degree of accuracy. Light from an end portion of an object is received by a pair of one- or two-dimensional image sensors and disposed at a predetermined angle relative to each other, and brightness outputs of individual picture elements of the image sensors are stored into memories. From the stored signals, a bright line produced by light from an edge of the object end portion is detected for each image sensor, and a position of the bright line is calculated as a digital amount from a number of picture elements for each image sensor. Then, the digital amounts are added and substracted between the image sensors. A defect is judged from results of the addition and subtraction.

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