Method of detecting the position of an object pattern in an image
Patent 5226095 Issued on July 6, 1993. Estimated Expiration Date: 
May 26, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
May 26, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3898617 Pattern position detecting system Pattern features extracting apparatus and method Vision inspection system Patent #: 4581762 InventorsAssigneeApplicationNo. 890323 filed on 05/26/1992US Classes:382/151, Alignment, registration, or position determination382/291Determining the position of an objectExaminersPrimary: Moore, David K.Assistant: Fox, David T. Attorney, Agent or FirmInternational ClassG06K 009/36Foreign Application Priority Data1988-11-04 JPAbstractA method in which the position of an object pattern in an image can be accurately detected is disclosed. The method comprises the steps of: (a) preparing a reference pattern which has a pattern and a background which are composed of pixels each having a value regarding the brightness or gradation; (b) dividing the image into a plurality of sections; (c) selecting arbitrarily an area having two or more of the sections; (d) obtaining the brightness data from each of the sections; (e) obtaining a sum of products of the value of each pixel and the brightness data of each section corresponding to the pixel; (f) moving the area to another position in the image; (g) repeating steps (d) to (f); and (h) deciding that the area from which the sum having an extreme value is obtained is the one containing the object pattern.Other References
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