Acoustic microscope system
Patent 5211059 Issued on May 18, 1993. Estimated Expiration Date: 
November 29, 2011. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
November 29, 2011. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesReflection acoustic microscope for precision differential phase imaging Method for measurement of velocity of surface acoustic wave Ultrasonic microscope system Surface ultrasonic wave interference microscope Patent #: 4655083 InventorsAssigneeApplicationNo. 800117 filed on 11/29/1991US Classes:73/606, Imaging of discontinuity with stationary sonic transmitter73/626SwitchedExaminersPrimary: Williams, HezronAssistant: Ashraf, Nashmiya Attorney, Agent or FirmForeign Patent References
International ClassG01N 029/000Foreign Application Priority Data1990-11-29 JPAbstractThe present invention relates to an acoustic microscope system having an ultrasonic probe that is driven with a high-frequency burst signal to radiate an ultrasonic signal and that detects the resulting reflected and irradiated waves, a Z-axis moving device that updates the vertical distance Z between the probe and a material of interest for each sampling position, and device for constructing a V(z) curve from the reflection signals obtained at respective sampling positions. The ultrasonic probe of the invention is provided with an acoustic lens, a first ultrasonic transducer for receiving a leaky surface skimming compressional wave reflected from a sample material on one side of the acoustic lens, and a second ultrasonic transducer also provided on the side of the acoustic lens for receiving a leaky surface acoustic wave.Other References
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