U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Inspection method using unique templates and histogram analysis

Patent 5204911 Issued on April 20, 1993. Estimated Expiration Date: Icon_subject May 29, 2011. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Process and apparatus for automatically identifying discount coupons and the like by means of electronic comparison
Patent #: 4231014
Issued on: 10/28/1980
Inventor: Ponzio

Inspecting articles
Patent #: 4637054
Issued on: 01/13/1987
Inventor: Hashim

Method for automatically inspecting parts utilizing machine vision and system utilizing same
Patent #: 4759074
Issued on: 07/19/1988
Inventor: Iadipaolo ,   et al.

Process and arrangements for the indentification marking and recognition of objects
Patent #: 4809342
Issued on: 02/28/1989
Inventor: Kappner

Label inspection apparatus sensing reflectivity values
Patent #: 4859863
Issued on: 08/22/1989
Inventor: Schrader ,   et al.

Method of and apparatus for detecting objects in an assembly line
Patent #: 4995091
Issued on: 02/19/1991
Inventor: Shimbara

Object inspection apparatus Patent #: 5007096
Issued on: 04/09/1991
Inventor: Yoshida

Inventors

Application

No. 706800 filed on 05/29/1991

US Classes:

382/142, Bottle inspection348/92, Quality inspection356/239.4, Containers (e.g., bottles)382/168HISTOGRAM PROCESSING

Examiners

Primary: Mancuso, Joseph

Attorney, Agent or Firm

International Class

G06K 009/00

Abstract

A technique for detecting defects in stationary products or in products moving on a production line (102, FIG. 12) by analyzing their images uses a matrix or line-scan camera (104, FIG. 12) for taking images of products (102). The product's dimensions are measured with accuracy and the sizes and positions of their surface defects are determined. The technique is much faster and more accurate than current techniques and is based on an analysis of the histogram of the full image (C, FIG. 2). A carefully selected template image (A, FIG. 1) is created and saved in the memory of a computer (106, FIG. 12). The method also includes the steps of: creating and saving a histogram vector of the template image; loading look-up tables with a shifting and quantizing function for the image gray levels; saving a product image in memory to be superposed onto template image (FIG. 1); creating and saving a histogram vector of the result superposed image; analyzing the resulting histograms, i.e., finding discontinuations, changes the values of gray levels, appearance of new gray levels, etc. This results in the detection of product dimensions or surface defects and allows deciphering of product codes.

PatentsPlus Images
Enhanced PDF formats
loading...
PatentsPlus: add to cart
PatentsPlus: add to cartSearch-enhanced full patent PDF image
$9.95more info
PatentsPlus: add to cart
PatentsPlus: add to cartIntelligent turbocharged patent PDFs with marked up images
$16.95more info
 
Sign InRegister
Username  
Password   
forgot password?